Cora Salm

13 papers Journal 12Unranked 1
YearRankTypeTitle / Venue / Authors
2020 — conf
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices.
IRPS
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
2018 J jnl
Towards understanding recovery of hot-carrier induced degradation.
Microelectron. Reliab.
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
2017 J jnl
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs.
Microelectron. Reliab.
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
2008 J jnl
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip.
Microelectron. Reliab.
Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz
2007 J jnl
Low-Frequency Noise Phenomena in Switched MOSFETs.
IEEE J. Solid State Circuits
Arnoud P. van der Wel, Eric A. M. Klumperink, Jay S. Kolhatkar, Eric Hoekstra, Martijn F. Snoeij, Cora Salm, Hans Wallinga, Bram Nauta
2007 J jnl
Low-frequency noise in hot-carrier degraded nMOSFETs.
Microelectron. Reliab.
Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz
2006 J jnl
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs.
Microelectron. Reliab.
Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz
2005 J jnl
A 3-D Circuit Model to evaluate CDM performance of ICs.
Microelectron. Reliab.
M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
2004 J jnl
Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect.
Microelectron. Reliab.
Zhichun Wang, Jan Ackaert, Cora Salm, Fred G. Kuper, Eddy De Backer
2003 J jnl
Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy.
Microelectron. Reliab.
M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
2002 J jnl
Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling.
Microelectron. Reliab.
H. V. Nguyen, Cora Salm, J. Vroemen, J. Voets, Benno Krabbenborg, Jaap Bisschop, A. J. Mouthaan, Fred G. Kuper
2002 J jnl
Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime.
Microelectron. Reliab.
H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper
2002 J jnl
The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress.
Microelectron. Reliab.
M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper