Constantinos Xanthopoulos

17 papers A 8C 2Misc 4Journal 3
YearRankTypeTitle / Venue / Authors
2023 Misc conf
Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.
VTS
V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris
2022 A conf
Improvements in Automated IC Socket Pin Defect Detection.
ITC
Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao
2022 A conf
Zero Trust Approach to IC Manufacturing and Testing.
ITC
Brian Buras, Constantinos Xanthopoulos, Ken Butler, Jason Kim
2021 J jnl
On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris
2021 Misc conf
Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation.
VTS
V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, E. De la Rosa, C. Alleyne, S. Mier, Yiorgos Makris
2020 A conf
Automated Socket Anomaly Detection through Deep Learning.
ITC
Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal
2020 J jnl
On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement.
CoRR
Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris
2019 C conf
Automated Die Inking through On-line Machine Learning.
IOLTS
Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris
2019 Misc conf
Machine Learning-based Noise Classification and Decomposition in RF Transceivers.
VTS
Deepika Neethirajan, Constantinos Xanthopoulos, Kiruba S. Subramani, Keith Schaub, Ira Leventhal, Yiorgos Makris
2019 A conf
Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion.
ITC
Kosuke Ikeda, Keith Schaub, Ira Leventhal, Yiorgos Makris, Constantinos Xanthopoulos, Deepika Neethirajan
2019 A conf
Wafer-Level Adaptive Vmin Calibration Seed Forecasting.
DATE
Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris
2018 Misc conf
Enhanced hotspot detection through synthetic pattern generation and design of experiments.
VTS
Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris
2017 A conf
Automated die inking: A pattern recognition-based approach.
ITC
Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris
2017 C conf
Wafer-level adaptive trim seed forecasting based on E-tests.
ISCAS
Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris
2016 A conf
Harnessing process variations for optimizing wafer-level probe-test flow.
ITC
Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
2015 J jnl
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.
IEEE Des. Test
Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris
2014 A conf
IC laser trimming speed-up through wafer-level spatial correlation modeling.
ITC
Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris