Claudia Bertani

13 papers C 2Misc 1Journal 6Unranked 4

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs. IEEE Trans. Computers Gabriele Filipponi, Denis Schwachhofer, Francesco Angione, Claudia Bertani, Simone Corbellini, Nicola Di Gruttola Giardino, Giuseppe Garozzo, Giorgio Insinga, Vincenzo Tancorre, Paolo Bernardi
2025	J	`jnl`	A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs. IEEE Trans. Computers Giusy Iaria, Paolo Bernardi, Claudia Bertani, Lorenzo Cardone, Giuseppe Garozzo, Vincenzo Tancorre
2025	J	`jnl`	A Novel Indirect Methodology Based on Execution Traces for Grading Functional Test Programs. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, Stefano Quer, Claudia Bertani, Vincenzo Tancorre
2025	J	`jnl`	A System-Level Test Methodology for Communication Peripherals in System-on-Chips. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Claudia Bertani, Vincenzo Tancorre
2025	J	`jnl`	Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre
2025	—	`conf`	Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs. LATS Paolo Bernardi, Gabriele Filipponi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre
2025	—	`conf`	Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs. LATS Francesco Angione, Paolo Bernardi, Claudia Bertani, Lorenzo Bertetto, Lorenzo Cardone, Nicola Di Gruttola Giardino, Stefano Quer, Vincenzo Tancorre
2024	—	`conf`	A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. DFT Nicola Di Gruttola Giardino, Francesco Angione, Paolo Bernardi, Tommaso Foscale, Claudia Bertani, Vincenzo Tancorre
2023	J	`jnl`	A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023	Misc	`conf`	A guided debugger-based fault injection methodology for assessing functional test programs. VTS Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023	C	`conf`	Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2021	—	`conf`	Innovative methods for Burn-In related Stress Metrics Computation. DTIS Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli
2020	C	`conf`	Applicative System Level Test introduction to Increase Confidence on Screening Quality. DDECS Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali