| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IET Comput. Digit. Tech.
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
IET Comput. Digit. Tech.
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | C | conf |
ISCAS
|
| 2019 | — | conf |
ASYNC
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2018 | Misc | conf |
VTS
|
| 2018 | J | jnl |
J. Signal Process. Syst.
|
| 2018 | J | jnl |
J. Signal Process. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
CoRR
|
| 2017 | Misc | conf |
VTS
|
| 2017 | — | conf |
NEWCAS
|
| 2017 | — | book |
|
| 2017 | J | jnl |
CoRR
|
| 2017 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2016 | Misc | conf |
ACSSC
|
| 2016 | C | conf |
ISCAS
|
| 2016 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2016 | — | conf |
CCECE
|
| 2016 | — | ch. |
Handbook of Pattern Recognition and Computer Vision
|
| 2016 | J | jnl |
IEEE J. Sel. Areas Commun.
|
| 2016 | J | jnl |
CoRR
|
| 2016 | J | jnl |
IEEE Trans. Commun.
|
| 2016 | J | jnl |
CoRR
|
| 2016 | C | conf |
ISCAS
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2016 | Misc | conf |
ICASSP
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | Misc | conf |
VTS
|
| 2015 | — | conf |
SiPS
|
| 2015 | — | conf |
ASYNC
|
| 2015 | — | conf |
EWDTS
|
| 2015 | J | jnl |
CoRR
|
| 2015 | J | jnl |
CoRR
|
| 2015 | Misc | conf |
VTS
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | J | jnl |
CoRR
|
| 2015 | C | conf |
IOLTS
|
| 2015 | J | jnl |
CoRR
|
| 2015 | — | conf |
NEWCAS
|
| 2015 | J | jnl |
CoRR
|
| 2015 | J | jnl |
CoRR
|
| 2014 | J | jnl |
CoRR
|
| 2014 | — | conf |
GlobalSIP
|
| 2014 | J | jnl |
IEEE J. Sel. Areas Commun.
|
| 2014 | Misc | conf |
ICASSP
|
| 2014 | J | jnl |
CoRR
|
| 2014 | — | conf |
SiPS
|
| 2014 | C | conf |
IOLTS
|
| 2014 | J | jnl |
CoRR
|
| 2014 | C | conf |
MEMOCODE
|
| 2013 | — | conf |
MWSCAS
|
| 2013 | J | jnl |
CoRR
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2013 | — | conf |
NEWCAS
|
| 2013 | — | conf |
FTSCS
|
| 2013 | J | jnl |
CoRR
|
| 2013 | J | jnl |
CoRR
|
| 2013 | B | conf |
IWCMC
|
| 2013 | J | jnl |
CoRR
|
| 2012 | — | conf |
MILCOM
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
CCECE
|
| 2012 | — | conf |
DASIP
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | J | jnl |
IEEE Commun. Mag.
|
| 2011 | — | conf |
ECCTD
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2009 | J | jnl |
Microelectron. J.
|
| 2007 | J | jnl |
IET Comput. Digit. Tech.
|
| 2007 | Misc | conf |
VTS
|
| 2004 | Misc | conf |
VTS
|
| 2003 | — | conf |
DFT
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2002 | Misc | conf |
VTS
|
| 2002 | — | conf |
DFT
|
| 2001 | Misc | conf |
VTS
|
| 2000 | J | jnl |
J. Electron. Test.
|
| 2000 | Misc | conf |
VTS
|
| 2000 | A | conf |
ITC
|
| 2000 | J | jnl |
IEEE Trans. Computers
|
| 1999 | J | jnl |
IEEE Trans. Computers
|
| 1999 | A | conf |
ITC
|
| 1999 | Misc | conf |
VTS
|
| 1998 | A | conf |
ITC
|
| 1998 | — | conf |
DFT
|
| 1998 | — | conf |
DFT
|
| 1997 | — | conf |
DFT
|
| 1997 | Misc | conf |
VTS
|
| 1997 | — | conf |
DFT
|
| 1996 | — | conf |
DFT
|
| 1996 | J | jnl |
IEEE Des. Test Comput.
|
| 1995 | Misc | conf |
VTS
|
| 1995 | J | jnl |
IEEE Trans. Computers
|
| 1995 | — | conf |
DFT
|
| 1994 | J | jnl |
IEEE Trans. Computers
|
| 1994 | — | conf |
DFT
|
| 1993 | — | conf |
DFT
|
| 1992 | J | jnl |
J. Circuits Syst. Comput.
|
| 1992 | J | jnl |
J. Electron. Test.
|
| 1990 | — | conf |
FTCS
|