Chunsheng Liu

19 papers A 5Misc 2Journal 9Unranked 3
YearRankTypeTitle / Venue / Authors
2023 J jnl
Special Issue on Testability and Dependability of Artificial Intelligence Hardware.
IEEE Des. Test
Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos
2023 J jnl
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives.
IEEE Des. Test
Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos
2022 J jnl
C-Testing and Efficient Fault Localization for AI Accelerators.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
2020 — conf
C-Testing of AI Accelerators
ATS
Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
2006 J jnl
Constraint-Driven Test Scheduling for NoC-Based Systems.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Érika F. Cota, Chunsheng Liu
2006 A conf
Reuse-based test access and integrated test scheduling for network-on-chip.
DATE
Chunsheng Liu, Zach Link, Dhiraj K. Pradhan
2006 Misc conf
Thermal-Aware Testing of Network-on-Chip Using Multiple-Frequency Clocking.
VTS
Chunsheng Liu, Vikram Iyengar, Dhiraj K. Pradhan
2005 J jnl
Design and analysis of compact dictionaries for diagnosis in scan-BIST.
IEEE Trans. Very Large Scale Integr. Syst.
Chunsheng Liu, Krishnendu Chakrabarty
2005 J jnl
EBIST: a novel test generator with built-in fault detection capability.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dhiraj K. Pradhan, Chunsheng Liu
2005 Misc conf
Power-Aware Test Scheduling in Network-on-Chip Using Variable-Rate On-Chip Clocking.
VTS
Chunsheng Liu, Vikram Iyengar, Jiangfan Shi, Érika F. Cota
2004 — conf
Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST.
ISVLSI
Chunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. Blanton
2004 J jnl
Compact Dictionaries for Fault Diagnosis in Scan-BIST.
IEEE Trans. Computers
Chunsheng Liu, Krishnendu Chakrabarty
2004 J jnl
Identification of error-capturing scan cells in scan-BIST with applications to system-on-chip.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Chunsheng Liu, Krishnendu Chakrabarty
2004 A conf
Test Scheduling for Network-on-Chip with BIST and Precedence Constraints.
ITC
Chunsheng Liu, Hamid Sharif, Érika F. Cota, Dhiraj K. Pradhan
2003 A conf
A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis.
DATE
Chunsheng Liu, Krishnendu Chakrabarty
2003 — conf
Compact Dictionaries for Fault Diagnosis in BIST.
ISQED
Chunsheng Liu, Krishnendu Chakrabarty
2003 A conf
EBIST: A Novel Test Generator with Built-In Fault Detection Capability.
DATE
Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakrabarty
2003 J jnl
Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Chunsheng Liu, Krishnendu Chakrabarty
2002 A conf
An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment.
DATE
Chunsheng Liu, Krishnendu Chakrabarty, Michael Gössel