| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE J. Solid State Circuits
|
| 2025 | — | conf |
CICC
|
| 2025 | — | conf |
DFT
|
| 2024 | — | conf |
DFT
|
| 2021 | B | conf |
ETS
|
| 2021 | J | jnl |
J. Electron. Test.
|
| 2021 | A | conf |
ITC
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
ITC-Asia
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | — | conf |
VLSI-DAT
|
| 2020 | — | conf |
IRC
|
| 2020 | — | conf |
ICCE-TW
|
| 2020 | — | conf |
ATS
|
| 2019 | — | conf |
3DIC
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | — | conf |
DFT
|
| 2019 | — | conf |
ASP-DAC
|
| 2018 | — | conf |
ISOCC
|
| 2018 | J | jnl |
Sensors
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2015 | — | conf |
ASP-DAC
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2011 | — | conf |
SoCC
|
| 2010 | — | conf |
DFT
|
| 2010 | — | conf |
DFT
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | — | conf |
APCCAS
|
| 2010 | — | conf |
APCCAS
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2008 | J | jnl |
J. Signal Process. Syst.
|
| 2008 | — | conf |
APCCAS
|
| 2007 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2006 | — | conf |
APCCAS
|
| 2006 | — | conf |
APCCAS
|
| 2006 | C | conf |
ISCAS
|
| 2006 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|