Chuanhe Jay Shan

11 papers A 7Misc 1Journal 1Unranked 2
YearRankTypeTitle / Venue / Authors
2021 A conf
MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification.
ITC
Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan
2020 A conf
Learning A Wafer Feature With One Training Sample.
ITC
Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa
2019 A conf
Deploying A Machine Learning Solution As A Surrogate.
ITC
Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa
2019 A conf
Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper.
ICCAD
Li-C. Wang, Chuanhe Jay Shan, Ahmed Wahba
2019 — conf
Primitive Concept Identification In A Given Set Of Wafer Maps.
VLSI-DAT
Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2019 — conf
Wafer Plot Classification Using Neural Networks and Tensor Methods.
ITC-Asia
Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2018 A conf
Concept Recognition in Production Yield Data Analytics.
ITC
Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2018 J jnl
Discovering Interesting Plots in Production Yield Data Analytics.
CoRR
Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2017 A conf
Some considerations on choosing an outlier method for automotive product lines.
ITC
Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg
2017 A conf
Systematic defect detection methodology for volume diagnosis: A data mining perspective.
ITC
Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang
2016 Misc conf
Consistency in wafer based outlier screening.
VTS
Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli