Chryssa Dislis

16 papers A 7B 1C 1Journal 5Unranked 2

Year	Rank	Type	Title / Venue / Authors
2002	B	`conf`	Improving Service Availability via Low-Outage Upgrades. COMPSAC Chryssa Dislis
2001	A	`conf`	Incorporating Software Reliability Engineering into the Test Process for an Extensive GUI-Based Network Management System. ISSRE Deirdre Donovan, Chryssa Dislis, Ray Murphy, Stephen Unger, Christina Kenneally, Janet Young, Liz Sheehan
1999	A	`conf`	Test process optimization: closing the gap in the defect spectrum. ITC Norma Barrett, Simon Martin, Chryssa Dislis
1999	A	`conf`	The evolution of a system test process [for Motorola GSM products]. ITC Simon Martin, Robert Bleck, Chryssa Dislis, Des Farren
1998	J	`jnl`	Clinical potential and design of programmable mechanical impedances for orthotic applications. Robotica William S. Harwin, Lee O. Leiber, Gregory P. G. Austwick, Chryssa Dislis
1998	—	`conf`	Formal Design Techniques - Theory and Engineering Reality. Asian Test Symposium Chryssa Dislis, Gerry Musgrave, Roger B. Hughes
1998	J	`jnl`	Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems. IEEE Des. Test Comput. David E. Schimmel, Chryssa Dislis
1996	—	`conf`	Economics Modelling and Optimisation of MCM Test Strategies. ED&TC Chryssa Dislis, Ian P. Jalowiecki
1995	A	`conf`	MCM Quality and Cost Analysis Using Economics Models. ITC Chryssa Dislis, A. F. Al-Ani, Ian P. Jalowiecki
1994	J	`jnl`	Sensitivity analysis in economics based test strategy planning. J. Electron. Test. J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler
1994	J	`jnl`	Test strategy planning using economic analysis. J. Electron. Test. I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
1993	A	`conf`	Algorithms for Cost Optimised Test Strategy Selection. ITC Chryssa Dislis, J. H. Dick, Anthony P. Ambler
1993	A	`conf`	Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler
1993	C	`conf`	Economics in Design and Test. ICCD Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick
1991	J	`jnl`	Economic Effects in Design and Test. IEEE Des. Test Comput. I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
1989	A	`conf`	Cost Analysis of Test Method Environments. ITC Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler