Christoforos G. Theodorou

16 papers Journal 1Unranked 15
YearRankTypeTitle / Venue / Authors
2024 — conf
Breakthrough Processes for Si CMOS Devices with BEOL Compatibility for 3D Sequential Integrated more than Moore Analog Applications.
VLSI Technology and Circuits
Daphnée Bosch, Abygaël Viey, Tadeu Mota Frutuoso, P. Lheritier, C. Licitra, Nada Zerhouni, A. Albouy, Laurent Brunet, A. Magalhaes-Lucas, L. M. B. da Silva, H. Boutry, M. Husien Fahmy Taha Abdelrahman, F. Cristiano, R. Gassilloud, M. Ribotta, G. Romano, William Vandendaele, V. Benevent, Mathieu Opprecht, S. Kerdilès, F. Milesi, F. Mazen, Benoit Sklénard, C. Euvrard-Colnat, Johannes Sturm, Amélie Lambert, C. Candebage, L. Laraignou, François Boulard, A. Sarrazin, M. de Souza, Christoforos G. Theodorou, Xavier Garros, Perrine Batude
2023 — conf
Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10K.
IRPS
F. Serra Di Santa Maria, Francis Balestra, Christoforos G. Theodorou, Gérard Ghibaudo, Cezar B. Zota, Eunjung Cha
2022 — conf
Accounting for Current Degradation Effects in the Compact Noise Modeling of Nano-scale MOSFETs.
MOCAST
Angeliki Tataridou, Christoforos G. Theodorou
2022 — conf
In-depth electrical characterization of deca-nanometer InGaAs MOSFET down to cryogenic temperatures for low-power quantum applications.
ESSDERC
F. Serra Di Santa Maria, Christoforos G. Theodorou, Francis Balestra, Gérard Ghibaudo, Eunjung Cha, Cezar B. Zota
2021 — conf
"Pinch to Detect": A Method to Increase the Number of Detectable RTN Traps in Nano-scale MOSFETs.
IRPS
Angeliki Tataridou, Gérard Ghibaudo, Christoforos G. Theodorou
2021 — conf
Inter-tier Coupling Analysis in Back-illuminated Monolithic 3DSI Image Sensor Pixels.
MOCAST
Petros Sideris, Arnaud Peizerat, Perrine Batude, Christoforos G. Theodorou, Gilles Sicard
2021 — conf
VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits.
ESSDERC
Angeliki Tataridou, Gérard Ghibaudo, Christoforos G. Theodorou
2018 — conf
1/f Noise Characterization of Piezoresistive Nano-Gauges for MEMS Sensors.
IEEE SENSORS
Antoine Nowodzinski, Dihia Sidi Ahmed, Christoforos G. Theodorou, Alexandra Kournela, Hélène Duchemin, Cyril Dressler, Audrey Berthelot, Hélène Lhermer
2018 — conf
Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator.
ESSDERC
Theano A. Karatsori, K. Bennamane, Christoforos G. Theodorou, L. Czornomaz, Jean Fompeyrine, Cezar B. Zota, Clarissa Convertino, Gérard Ghibaudo
2016 J jnl
Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.
Microelectron. Reliab.
Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis, Gérard Ghibaudo, C. A. Dimitriadis
2016 — conf
Noise-induced dynamic variability in nano-scale CMOS SRAM cells.
ESSDERC
Christoforos G. Theodorou, Mouenes Fadlallah, Xavier Garros, Charalambos A. Dimitriadis, Gérard Ghibaudo
2016 — conf
Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.
ESSDERC
R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo
2015 — conf
New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs.
IRPS
Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Emmanuel Josse, Charalambos A. Dimitriadis, Gérard Ghibaudo
2014 — conf
Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs.
ESSDERC
Eleftherios G. Ioannidis, Sébastien Haendler, Christoforos G. Theodorou, Nicolas Planes, Charalabos A. Dimitriadis, Gérard Ghibaudo
2012 — conf
Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs.
ESSDERC
Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Franck Arnaud, Jalal Jomaah, Charalambos A. Dimitriadis, Gérard Ghibaudo
2009 — conf
A new linear voltage-to-current converter with threshold voltage compensation for analog circuits applications in polycrystalline silicon TFT process.
ICECS
Ilias Pappas, Christoforos G. Theodorou, Stylianos Siskos, Charalambos A. Dimitriadis