| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | C | conf |
SERA
|
| 2025 | — | conf |
CIbSE
|
| 2024 | C | conf |
CLEI
|
| 2024 | — | conf |
IWSiB@ICSE
|
| 2023 | — | ed. |
CIbSE
|
| 2023 | C | conf |
CLEI
|
| 2023 | — | conf |
CSEE&T
|
| 2021 | — | ed. |
CIbSE
|
| 2021 | — | conf |
CIbSE
|
| 2021 | — | conf |
PROMISE
|
| 2021 | — | conf |
WorldCIST (3)
|
| 2021 | — | conf |
ICITS (2)
|
| 2021 | — | conf |
CIbSE
|
| 2021 | Misc | conf |
QUATIC
|
| 2021 | J | jnl |
CLEI Electron. J.
|
| 2020 | — | conf |
CIbSE
|
| 2020 | — | conf |
ICITS
|
| 2020 | — | conf |
IntelliSys (2)
|
| 2020 | — | conf |
IntelliSys (2)
|
| 2020 | — | conf |
PROMISE
|
| 2020 | J | jnl |
IET Softw.
|
| 2020 | — | conf |
CIbSE
|
| 2020 | C | conf |
CLEI
|
| 2020 | — | conf |
CIbSE
|
| 2019 | — | conf |
CIbSE
|
| 2019 | B | conf |
PROFES
|
| 2019 | J | jnl |
J. Softw. Eng. Res. Dev.
|
| 2019 | — | conf |
ICITS
|
| 2019 | C | conf |
CLEI
|
| 2019 | J | jnl |
CLEI Electron. J.
|
| 2019 | — | conf |
Using Model-Based Testing to Reduce Test Automation Technical Debt: An Industrial Experience Report.
ICITS
|
| 2018 | — | conf |
CIbSE
|
| 2018 | — | conf |
CIbSE
|
| 2018 | — | conf |
CIbSE
|
| 2017 | J | jnl |
J. Softw. Eng. Res. Dev.
|
| 2017 | J | jnl |
Empir. Softw. Eng.
|
| 2017 | — | conf |
CIbSE
|
| 2017 | — | conf |
IWSM-Mensura
|
| 2017 | — | conf |
Un Estudio sobre las Prácticas de la Ingeniería del Software en Costa Rica: Resultados Preliminares.
CIbSE
|
| 2016 | — | conf |
CIbSE
|
| 2016 | — | conf |
CIbSE
|
| 2016 | J | jnl |
J. Object Technol.
|
| 2015 | — | conf |
CIbSE
|
| 2015 | — | conf |
CIbSE
|
| 2015 | B | conf |
PROFES
|
| 2015 | — | conf |
CIbSE
|
| 2015 | — | conf |
CIbSE
|
| 2015 | J | jnl |
ACM SIGSOFT Softw. Eng. Notes
|
| 2014 | A | conf |
ESEM
|