Christian Dua

12 papers Journal 11Unranked 1
YearRankTypeTitle / Venue / Authors
2018 J jnl
Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes.
Microelectron. Reliab.
Mourad Oualli, Christian Dua, O. Patard, P. Altuntas, S. Piotrowicz, Piero Gamarra, Cedric Lacam, J.-C. Jacquet, L. Teisseire, D. Lancereau, Eric Chartier, C. Potier, Sylvain L. Delage
2014 — conf
Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences.
ESSDERC
Isabella Rossetto, Fabiana Rampazzo, Simone Gerardin, Matteo Meneghini, Marta Bagatin, Alberto Zanandrea, Alessandro Paccagnella, Gaudenzio Meneghesso, Enrico Zanoni, Christian Dua, Marie-Antoinette di Forte-Poisson, Raphael Aubry, Mourad Oualli, Sylvain L. Delage
2014 J jnl
Influence of different carbon doping on the performance and reliability of InAlN/GaN HEMTs.
Microelectron. Reliab.
Isabella Rossetto, Fabiana Rampazzo, Matteo Meneghini, Marco Silvestri, Christian Dua, Piero Gamarra, Raphael Aubry, Marie-Antoinette di Forte-Poisson, O. Patard, Sylvain L. Delage, Gaudenzio Meneghesso, Enrico Zanoni
2013 J jnl
Comparison of the performances of an InAlN/GaN HEMT with a Mo/Au gate or a Ni/Pt/Au gate.
Microelectron. Reliab.
Isabella Rossetto, Fabiana Rampazzo, Riccardo Silvestri, Alberto Zanandrea, Christian Dua, Sylvain L. Delage, Mourad Oualli, Matteo Meneghini, Enrico Zanoni, Gaudenzio Meneghesso
2009 J jnl
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs.
Microelectron. Reliab.
Nathalie Malbert, Nathalie Labat, Arnaud Curutchet, C. Sury, V. Hoel, J.-C. de Jaeger, Nicolas Defrance, Y. Douvry, Christian Dua, Mourad Oualli, C. Bru-Chevallier, Jean-Marie Bluet, W. Chikhaoui
2009 J jnl
Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs.
Microelectron. Reliab.
Michele Piazza, Christian Dua, Mourad Oualli, Erwan Morvan, Dominique Carisetti, Frédéric Wyczisk
2007 J jnl
Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs.
Microelectron. Reliab.
Mustapha Faqir, Giovanni Verzellesi, Fausto Fantini, Francesca Danesin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, André Touboul, Christian Dua
2006 J jnl
AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements.
Microelectron. Reliab.
A. Sozza, Arnaud Curutchet, Christian Dua, Nathalie Malbert, Nathalie Labat, André Touboul
2005 J jnl
A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications.
Microelectron. Reliab.
A. Sozza, Christian Dua, Erwan Morvan, Bertrand Grimbert, Sylvain L. Delage
2004 J jnl
Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET.
Microelectron. Reliab.
A. Sozza, Christian Dua, A. Kerlain, C. Brylinski, Enrico Zanoni
2004 J jnl
Reliability Investigation of Gallium Nitride HEMT.
Microelectron. Reliab.
A. Sozza, Christian Dua, Erwan Morvan, Bertrand Grimbert, V. Hoel, Sylvain L. Delage, N. Chaturvedi, Richard Lossy, Joachim Würfl
2003 J jnl
Wide band gap semiconductor reliability : Status and trends.
Microelectron. Reliab.
Sylvain L. Delage, Christian Dua