Christian Boit

57 papers A* 2A 5C 5Misc 1Journal 40Unranked 4
YearRankTypeTitle / Venue / Authors
2021 A conf
Nano Security: From Nano-Electronics to Secure Systems.
DATE
Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Güneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer
2021 Misc conf
Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities.
VTS
Elham Amini, Kai Bartels, Christian Boit, Marius Eggert, Norbert Herfurth, Tuba Kiyan, Thilo Krachenfels, Jean-Pierre Seifert, Shahin Tajik
2019 — conf
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis.
IRPS
Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes
2018 J jnl
Assessment of a Chip Backside Protection.
J. Hardw. Syst. Secur.
Elham Amini, Anne Beyreuther, Norbert Herfurth, Alexander Steigert, Bernd Szyszka, Christian Boit
2018 J jnl
Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera.
Microelectron. Reliab.
Ivo Vogt, Tomonori Nakamura, Ingrid De Wolf, Christian Boit
2018 J jnl
Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra.
Microelectron. Reliab.
Ivo Vogt, Tomonori Nakamura, B. Motamedi, Christian Boit
2018 J jnl
IC security and quality improvement by protection of chip backside against hardware attacks.
Microelectron. Reliab.
Elham Amini, Anne Beyreuther, Norbert Herfurth, Alexander Steigert, R. Muydinov, Bernd Szyszka, Christian Boit
2018 J jnl
Key Extraction Using Thermal Laser Stimulation A Case Study on Xilinx Ultrascale FPGAs.
IACR Trans. Cryptogr. Hardw. Embed. Syst.
Heiko Lohrke, Shahin Tajik, Thilo Krachenfels, Christian Boit, Jean-Pierre Seifert
2018 J jnl
Key Extraction using Thermal Laser Stimulation: A Case Study on Xilinx Ultrascale FPGAs.
IACR Cryptol. ePrint Arch.
Heiko Lohrke, Shahin Tajik, Thilo Krachenfels, Christian Boit, Jean-Pierre Seifert
2018 J jnl
Photon emission as a characterization tool for bipolar parasitics in FinFET technology.
Microelectron. Reliab.
Anne Beyreuther, Norbert Herfurth, Elham Amini, Tomonori Nakamura, Ingrid De Wolf, Christian Boit
2017 A* conf
On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs.
CCS
Shahin Tajik, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit
2017 J jnl
On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs.
IACR Cryptol. ePrint Arch.
Shahin Tajik, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit
2017 J jnl
Optical interaction in active analog circuit elements.
Microelectron. Reliab.
Ivo Vogt, Tomonori Nakamura, Christian Boit
2017 C conf
PUFMon: Security monitoring of FPGAs using physically unclonable functions.
IOLTS
Shahin Tajik, Julian Fietkau, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit
2017 J jnl
Photonic Side-Channel Analysis of Arbiter PUFs.
J. Cryptol.
Shahin Tajik, Enrico Dietz, Sven Frohmann, Helmar Dittrich, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit, Heinz-Wilhelm Hübers
2017 J jnl
Technologies for Heterogeneous Integration - Challenges and chances for fault isolation.
Microelectron. Reliab.
Christian Boit
2016 A conf
No Place to Hide: Contactless Probing of Secret Data on FPGAs.
CHES
Heiko Lohrke, Shahin Tajik, Christian Boit, Jean-Pierre Seifert
2016 J jnl
No Place to Hide: Contactless Probing of Secret Data on FPGAs.
IACR Cryptol. ePrint Arch.
Heiko Lohrke, Shahin Tajik, Christian Boit, Jean-Pierre Seifert
2015 J jnl
A Complete and Linear Physical Characterization Methodology for the Arbiter PUF Family.
IACR Cryptol. ePrint Arch.
Shahin Tajik, Enrico Dietz, Sven Frohmann, Helmar Dittrich, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit, Heinz-Wilhelm Hübers
2015 C conf
Laser Fault Attack on Physically Unclonable Functions.
FDTC
Shahin Tajik, Heiko Lohrke, Fatemeh Ganji, Jean-Pierre Seifert, Christian Boit
2015 J jnl
Ultra sensitive measurement of dielectric current under pulsed stress conditions.
Microelectron. Reliab.
Clemens Helfmeier, Anne Beyreuther, Alexander Fox, Christian Boit
2014 J jnl
Backside spectroscopic photon emission microscopy using intensified silicon CCD.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki
2014 J jnl
Editorial.
Microelectron. Reliab.
Christian Boit
2014 J jnl
Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm.
Microelectron. Reliab.
Philipp Scholz, Norbert Herfurth, Michael Sadowski, Ted R. Lundquist, Uwe Kerst, Christian Boit
2014 C conf
Emission Analysis of Hardware Implementations.
DSD
Shahin Tajik, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit
2014 J jnl
Focused ion beam contact to non-volatile memory cells.
Microelectron. Reliab.
Clemens Helfmeier, Rudolf Schlangen, Christian Boit
2014 J jnl
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery.
Microelectron. Reliab.
Ponky Ivo, Eunjung Melanie Cho, Przemyslaw Kotara, Lars Schellhase, Richard Lossy, Ute Zeimer, Anna Mogilatenko, Joachim Würfl, Günther Tränkle, Arkadiusz Glowacki, Christian Boit
2014 A conf
Physical Characterization of Arbiter PUFs.
CHES
Shahin Tajik, Enrico Dietz, Sven Frohmann, Jean-Pierre Seifert, Dmitry Nedospasov, Clemens Helfmeier, Christian Boit, Helmar Dittrich
2014 J jnl
Physical Characterization of Arbiter PUFs.
IACR Cryptol. ePrint Arch.
Shahin Tajik, Enrico Dietz, Sven Frohmann, Jean-Pierre Seifert, Dmitry Nedospasov, Clemens Helfmeier, Christian Boit, Helmar Dittrich
2014 A conf
Physical vulnerabilities of Physically Unclonable Functions.
DATE
Clemens Helfmeier, Christian Boit, Dmitry Nedospasov, Shahin Tajik, Jean-Pierre Seifert
2013 A* conf
Breaking and entering through the silicon.
CCS
Clemens Helfmeier, Dmitry Nedospasov, Christopher Tarnovsky, Jan Starbug Krissler, Christian Boit, Jean-Pierre Seifert
2013 — conf
Cloning Physically Unclonable Functions.
HOST
Clemens Helfmeier, Christian Boit, Dmitry Nedospasov, Jean-Pierre Seifert
2013 — conf
Feasibly clonable functions.
TrustED@CCS
Christian Boit, Clemens Helfmeier, Dmitry Nedospasov
2013 C conf
Invasive PUF Analysis.
FDTC
Dmitry Nedospasov, Jean-Pierre Seifert, Clemens Helfmeier, Christian Boit
2013 C conf
Security Risks Posed by Modern IC Debug and Diagnosis Tools.
FDTC
Christian Boit, Clemens Helfmeier, Uwe Kerst
2012 J jnl
Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources.
Microelectron. Reliab.
Carlo Pagano, Christian Boit, Arkadiusz Glowacki, Reiner Leihkauf, Yoshiyuki Yokoyama
2012 — conf
On charge sensors for FIB attack detection.
HOST
Clemens Helfmeier, Christian Boit, Uwe Kerst
2012 J jnl
Optimum Si thickness for backside detection of photon emission using Si-CCD.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
2011 J jnl
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements.
Microelectron. Reliab.
Ponky Ivo, Arkadiusz Glowacki, Eldad Bahat-Treidel, Richard Lossy, Joachim Würfl, Christian Boit, Günther Tränkle
2011 J jnl
Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation.
Microelectron. Reliab.
Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit
2011 J jnl
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
2010 J jnl
Extraction of local thin-film solar cell parameters by bias-dependent IR-LBIC.
Microelectron. Reliab.
Mahyar Boostandoost, Uwe Kerst, Christian Boit
2010 J jnl
Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments.
Microelectron. Reliab.
Philipp Scholz, Christian Gallrapp, Uwe Kerst, Ted R. Lundquist, Christian Boit
2009 J jnl
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.
Microelectron. Reliab.
Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle
2009 J jnl
Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing.
Microelectron. Reliab.
Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Ted R. Lundquist, Peter Egger, Christian Boit
2008 J jnl
Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology.
Microelectron. Reliab.
Ulrike Kindereit, Christian Boit, Uwe Kerst, Steven Kasapi, Radu Ispasoiu, Roy Ng, William K. Lo
2008 J jnl
Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits.
Microelectron. Reliab.
Piotr Laskowski, Arkadiusz Glowacki, Christian Boit
2008 J jnl
Physical Techniques for Chip-Backside IC Debug in Nanotechnologies.
IEEE Des. Test Comput.
Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist
2008 J jnl
Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition.
Microelectron. Reliab.
Tuba Kiyan, Christof Brillert, Christian Boit
2007 A conf
Backside E-Beam Probing on Nano scale devices.
ITC
Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krüger
2007 J jnl
Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy.
Microelectron. Reliab.
Rudolf Schlangen, Uwe Kerst, Christian Boit, Tahir Malik, Rajesh Jain, Ted R. Lundquist
2006 J jnl
Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node.
Microelectron. Reliab.
Rudolf Schlangen, Peter Sadewater, Uwe Kerst, Christian Boit
2005 J jnl
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations.
Microelectron. Reliab.
Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit
2005 J jnl
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout.
Microelectron. Reliab.
Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki
2004 J jnl
Localization of FET Device Performance with Thermal Laser Stimulation.
Microelectron. Reliab.
Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki, Hiroyoshi Suzuki
2001 J jnl
Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis.
Microelectron. Reliab.
Bernd Ebersberger, Alexander Olbrich, Christian Boit
2001 J jnl
Scanning probe microscopy in semiconductor failure analysis.
Microelectron. Reliab.
Bernd Ebersberger, Alexander Olbrich, Christian Boit