Chris Schuermyer

14 papers A 8Misc 1Journal 4Unranked 1

Year	Rank	Type	Title / Venue / Authors
2013	J	`jnl`	Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. IEEE Des. Test Shobhit Malik, Thomas Herrmann, Sriram Madhavan, Rao Desineni, Chris Schuermyer, Geir Eide
2012	—	`conf`	A Hybrid Flow for Memory Failure Bitmap Classification. Asian Test Symposium Jianbo Li, Yu Huang, Wu-Tung Cheng, Chris Schuermyer, Dong Xiang, Eric Faehn, Ruth Farrugia
2012	J	`jnl`	Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Des. Test Comput. Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann
2010	J	`jnl`	Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. IEEE Des. Test Comput. Manish Sharma, Chris Schuermyer, Brady Benware
2007	Misc	`conf`	Silicon Evaluation of Static Alternative Fault Models. VTS Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware
2006	A	`conf`	A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware
2006	J	`jnl`	Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer
2005	A	`conf`	Achieving higher yield through diagnosis-the ASIC perspective. ITC Chris Schuermyer
2005	A	`conf`	Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware
2004	A	`conf`	In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
2004	A	`conf`	Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC Chris Schuermyer, Jens Ruffler, W. Robert Daasch
2003	A	`conf`	Impact of Multiple-Detect Test Patterns on Product Quality. ITC Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
2003	A	`conf`	Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning
2002	A	`conf`	Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner