Chris Nigh

15 papers A 8B 2Misc 3Journal 1Unranked 1
YearRankTypeTitle / Venue / Authors
2025 Misc conf
CHEF: CHaracterizing Elusive Logic Circuit Failures.
VTS
Ruben Purdy, Chris Nigh, Wei Li, R. D. Shawn Blanton
2025 A conf
Debugging and Preventing Abnormally High Vmin during Logic Scan Test Bring-up.
ITC
Min-Hsin Liu, Ding-Wei Cheng, James Chien-Mo Li, Chris Nigh, Szu Huat Goh, Mason Chern, Bing-Han Hsieh, Subhadip Kundu
2025 A conf
IC-PEPR: PEPR Testing Goes Intra-Cell.
ITC
Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. (Shawn) Blanton
2024 B conf
Faulty Function Extraction for Defective Circuits.
ETS
Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton
2024 Misc conf
Logic-AAA: Debug of Logic Failures with an on-ATE Expert System.
VTS
Chris Nigh, Ronald D. Blanton
2024 B conf
Silent Data Corruption: Test or Reliability Problem?
ETS
Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen
2023 A conf
Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis.
ITC
Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava
2022 A conf
Diagnosing Double Faulty Chains through Failing Bit Separation.
ITC
Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern
2022 A conf
PEPR: Pseudo-Exhaustive Physically-Aware Region Testing.
ITC
Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton
2021 A conf
AAA: Automated, On-ATE AI Debug of Scan Chain Failures.
ITC
Chris Nigh, Gaurav Bhargava, Ronald D. Blanton
2021 J jnl
AdaTrust: Combinational Hardware Trojan Detection Through Adaptive Test Pattern Construction.
IEEE Trans. Very Large Scale Integr. Syst.
Chris Nigh, Alex Orailoglu
2021 A conf
Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization.
ITC
Mu-Ting Wu, Cheng-Sian Kuo, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava
2020 — conf
Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips.
ATS
Chih-Yan Liu, Mu-Ting Wu, James Chien-Mo Li, Gaurav Bhargava, Chris Nigh
2020 Misc conf
Taming Combinational Trojan Detection Challenges with Self-Referencing Adaptive Test Patterns.
VTS
Chris Nigh, Alex Orailoglu
2020 A conf
Test Pattern Superposition to Detect Hardware Trojans.
DATE
Chris Nigh, Alex Orailoglu