Chong-Gun Yu

16 papers C 2Journal 14
YearRankTypeTitle / Venue / Authors
2018 J jnl
Thermal energy harvesting circuit with maximum power point tracking control for self-powered sensor node applications.
Frontiers Inf. Technol. Electron. Eng.
Eun-Jung Yoon, Jong-Tae Park, Chong-Gun Yu
2016 J jnl
Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors.
Microelectron. Reliab.
Hyun Jun Jang, Chong-Gun Yu, Jong Tae Park
2016 J jnl
Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory.
Microelectron. Reliab.
Jin Hyung Choi, Chong-Gun Yu, Jong Tae Park
2015 J jnl
Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs.
Microelectron. Reliab.
Jae Hoon Lee, Jin-Woo Han, Chong-Gun Yu, Jong Tae Park
2014 J jnl
Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs.
Microelectron. Reliab.
Jin Hyung Choi, Jin-Woo Han, Chong-Gun Yu, Jong Tae Park
2013 J jnl
A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors.
Microelectron. Reliab.
Hyun Jun Jang, Seung Min Lee, Chong-Gun Yu, Jong Tae Park
2012 J jnl
Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs.
Microelectron. Reliab.
Seung-Min Lee, Chong-Gun Yu, Seung Min Jeong, Won-Ju Cho, Jong Tae Park
2011 J jnl
Effects of device layout on the drain breakdown voltages in MuGFETs.
Microelectron. Reliab.
Jin-Young Kim, Chong-Gun Yu, Jong Tae Park
2009 J jnl
NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer.
Microelectron. Reliab.
Yong Woo Jeon, Dae Hyun Ka, Chong-Gun Yu, Won-Ju Cho, M. Saif Islam, Jong Tae Park
2007 J jnl
Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs.
Microelectron. Reliab.
Sung Jun Jang, Dae Hyun Ka, Chong-Gun Yu, Kwan-Su Kim, Won-Ju Cho, Jong Tae Park
2006 J jnl
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors.
Microelectron. Reliab.
In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong Tae Park
2004 J jnl
Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's.
Microelectron. Reliab.
Se Re Na Yun, Chong-Gun Yu, Seok Hee Jeon, Chungkyue Kim, Jong Tae Park, Jean-Pierre Colinge
2003 J jnl
Increased hot carrier effects in Gate-All-Around SOI nMOSFET's.
Microelectron. Reliab.
Jong Tae Park, Nag Jong Choi, Chong-Gun Yu, Seok Hee Jeon, Jean-Pierre Colinge
1994 C conf
An Accurate and Matching-Free Threshold Voltage Extraction Scheme for MOS Transistors.
ISCAS
Chong-Gun Yu, Randall L. Geiger
1994 J jnl
An automatic offset compensation scheme with ping-pong control for CMOS operational amplifiers.
IEEE J. Solid State Circuits
Chong-Gun Yu, Randall L. Geiger
1993 C conf
Very Low Voltage Operational Amplifiers Using Floating Gate MOS Transistor.
ISCAS
Chong-Gun Yu, Randall L. Geiger