| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
O-COCOSDA
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | B | conf |
ETS
|
| 2023 | Misc | conf |
VTS
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
IEEE J. Solid State Circuits
|
| 2021 | A | conf |
ITC
|
| 2021 | A | conf |
DATE
|
| 2021 | A | conf |
ITC
|
| 2021 | A* | conf |
DAC
|
| 2020 | B | conf |
Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model.
ETS
|
| 2020 | — | conf |
A-SSCC
|
| 2019 | J | jnl |
J. Medical Imaging Health Informatics
|
| 2019 | — | conf |
ATS
|
| 2019 | C | conf |
DDECS
|