Ching-Nen Peng

12 papers A* 1A 4Misc 1Journal 5Unranked 1

Year	Rank	Type	Title / Venue / Authors
2017	J	`jnl`	A Built-Off Self-Repair Scheme for Channel-Based 3D Memories. IEEE Trans. Computers Hsuan-Hung Liu, Bing-Yang Lin, Cheng-Wen Wu, Wan-Ting Chiang, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2017	J	`jnl`	Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package. IEEE Des. Test Kai-Li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2016	J	`jnl`	A Local Parallel Search Approach for Memory Failure Pattern Identification. IEEE Trans. Computers Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2016	J	`jnl`	Configurable Cubical Redundancy Schemes for Channel-Based 3-D DRAM Yield Improvement. IEEE Des. Test Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2016	A*	`conf`	Efficient probing schemes for fine-pitch pads of InFO wafer-level chip-scale package. DAC Yu-Chieh Huang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2014	Misc	`conf`	A 4-GHz universal high-frequency on-chip testing platform for IP validation. VTS Ping-Lin Yang, Cheng-Chung Lin, Ming-Zhang Kuo, Sang-Hoo Dhong, Chien-Min Lin, Kevin Huang, Ching-Nen Peng, Min-Jer Wang
2014	—	`conf`	A novel DFT architecture for 3DIC test, diagnosis and repair. VLSI-DAT Mincent Lee, Saman Adham, Min-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Hao Chen
2014	J	`jnl`	On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs. IEEE Des. Test Chun-Chuan Chi, Bing-Yang Lin, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin, Ching-Nen Peng
2014	A	`conf`	Redundancy architectures for channel-based 3D DRAM yield improvement. ITC Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2014	A	`conf`	Wafer Level Chip Scale Package copper pillar probing. ITC Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2013	A	`conf`	Test-yield improvement of high-density probing technology using optimized metal backer with plastic patch. ITC Sen-Kuei Hsu, Hao Chen, Chung-Han Huang, Der-Jiann Liu, Wei-Hsun Lin, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2012	A	`conf`	A memory yield improvement scheme combining built-in self-repair and error correction codes. ITC Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang