| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | C | conf |
ISCAS
|
| 2023 | C | conf |
ISCAS
|
| 2022 | — | conf |
BioCAS
|
| 2022 | — | conf |
BioCAS
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | C | conf |
ISCAS
|
| 2021 | — | conf |
IECC
|
| 2021 | C | conf |
ISCAS
|
| 2020 | — | conf |
ASP-DAC
|
| 2020 | — | conf |
AICAS
|
| 2020 | C | conf |
ISCAS
|
| 2020 | C | conf |
ISCAS
|
| 2020 | — | conf |
VLSI-DAT
|
| 2019 | — | conf |
AICAS
|
| 2019 | — | conf |
ICBET
|
| 2019 | C | conf |
DDECS
|
| 2016 | — | conf |
ICCE-TW
|
| 2016 | — | conf |
ASP-DAC
|
| 2015 | — | conf |
VLSI-DAT
|
| 2015 | C | conf |
ISCAS
|
| 2015 | — | conf |
ICCE-TW
|
| 2015 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2014 | C | conf |
ISCAS
|
| 2013 | C | conf |
ISCAS
|
| 2013 | J | jnl |
VLSI Design
|
| 2013 | — | conf |
ASICON
|
| 2013 | J | jnl |
Microelectron. J.
|
| 2012 | — | conf |
VLSI-DAT
|
| 2011 | — | conf |
ASP-DAC
|
| 2011 | — | conf |
DSN Workshops
|
| 2011 | — | conf |
ASP-DAC
|
| 2011 | — | conf |
DSN Workshops
|
| 2011 | — | conf |
ASP-DAC
|
| 2010 | — | conf |
ASP-DAC
|
| 2010 | — | conf |
ASP-DAC
|
| 2010 | — | conf |
Fine resolution double edge clipping with calibration technique for built-in at-speed delay testing.
ASP-DAC
|
| 2009 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2009 | C | conf |
ISCAS
|
| 2009 | — | conf |
ASP-DAC
|
| 2009 | J | jnl |
IEICE Trans. Electron.
|
| 2009 | — | conf |
ASP-DAC
|
| 2009 | — | conf |
IIH-MSP
|
| 2009 | A | conf |
Fine resolution double edge clipping with calibration technique for built-in at-speed delay testing.
ITC
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2008 | Misc | conf |
VTS
|
| 2007 | — | conf |
ISSCC
|
| 2007 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2007 | C | conf |
ISCAS
|
| 2007 | Misc | conf |
VTS
|
| 2003 | — | conf |
DFT
|
| 2002 | — | conf |
DFT
|
| 2002 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2001 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2000 | — | conf |
LATW
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | — | conf |
DFT
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | A | conf |
ICCAD
|
| 1999 | — | conf |
DFT
|
| 1997 | J | jnl |
IEEE Trans. Computers
|
| 1995 | Misc | conf |
VLSI Design
|
| 1994 | Misc | conf |
EDCC
|