Chin-Lung Su

12 papers A 4Journal 4Unranked 4
YearRankTypeTitle / Venue / Authors
2015 A conf
Testing methods for quaternary content addressable memory using charge-sharing sensing scheme.
ITC
Hao-Yu Yang, Rei-Fu Huang, Chin-Lung Su, Kuan-Hong Lin, Hang-Kaung Shu, Chi-Wei Peng, Mango Chia-Tso Chao
2013 J jnl
Generalization of an Enhanced ECC Methodology for Low Power PSRAM.
IEEE Trans. Computers
Po-Yuan Chen, Chin-Lung Su, Chao-Hsun Chen, Cheng-Wen Wu
2011 J jnl
A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories.
IEEE Trans. Very Large Scale Integr. Syst.
Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Kun-Lun Luo, Wen Ching Wu
2010 J jnl
Diagnosis of MRAM Write Disturbance Fault.
IEEE Trans. Very Large Scale Integr. Syst.
Chin-Lung Su, Chih-Wea Tsai, Ching-Yi Chen, Wan-Yu Lo, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, Ming-Jer Kao
2008 — conf
Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault.
ATS
Wan-Yu Lo, Ching-Yi Chen, Chin-Lung Su, Cheng-Wen Wu
2008 J jnl
Write Disturbance Modeling and Testing for MRAM.
IEEE Trans. Very Large Scale Integr. Syst.
Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ding-Yeong Wang, Yuan-Jen Lee, Ming-Jer Kao
2007 A conf
Diagnosis for MRAM write disturbance fault.
ITC
Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, Ming-Jer Kao
2006 A conf
Testing MRAM for Write Disturbance Fault.
ITC
Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ming-Jer Kao
2005 — conf
An Integrated ECC and Redundancy Repair Scheme for Memory Reliability Enhancement.
DFT
Chin-Lung Su, Yi-Ting Yeh, Cheng-Wen Wu
2004 — conf
Fail Pattern Identification for Memory Built-In Self-Repair.
Asian Test Symposium
Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang
2004 A conf
MRAM Defect Analysis and Fault Modeli.
ITC
Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu
2003 — conf
A Processor-Based Built-In Self-Repair Design for Embedded Memories.
Asian Test Symposium
Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu