| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2026 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2024 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2023 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2022 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2021 | J | jnl |
Lamination Scheme of Curing Degree at Multiple Levels of Temperature With Location-Scale Regression.
IEEE Access
|
| 2019 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2019 | J | jnl |
Comput. Stat.
|
| 2017 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2014 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2012 | J | jnl |
Comput. Stat. Data Anal.
|
| 2012 | J | jnl |
IEEE Trans. Reliab.
|
| 2011 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2010 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2009 | J | jnl |
Exact computation of the null distribution of a test for multiple outliers in an exponential sample.
Comput. Stat. Data Anal.
|
| 2008 | J | jnl |
IEEE Trans. Reliab.
|
| 2008 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2005 | J | jnl |
SIAM J. Discret. Math.
|
| 2005 | J | jnl |
IEEE Trans. Reliab.
|
| 2005 | J | jnl |
IEEE Trans. Reliab.
|
| 2003 | J | jnl |
IEEE Trans. Reliab.
|
| 1993 | — | — |
The computation of probabilities which involve spacings, with applications to the scan statistic.
|