Chien-Mo James Li

23 papers A* 1A 7Misc 5Journal 5Unranked 5

Year	Rank	Type	Title / Venue / Authors
2024	J	`jnl`	FeBiM: Efficient and Compact Bayesian Inference Engine Empowered with Ferroelectric In-Memory Computing. CoRR Chao Li, Zhicheng Xu, Bo Wen, Ruibin Mao, Chien-Mo James Li, Thomas Kämpfe, Kai Ni, Xunzhao Yin
2022	—	`conf`	Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor. ISQED Shi-Tang Liu, Jia-Xian Chen, Yu-Tsung Wu, Chao-Ho Hsieh, Chien-Mo James Li, Norman Chang, Ying-Shiun Li, Wentze Chuang
2022	—	`conf`	Vector-based Dynamic IR-drop Prediction Using Machine Learning. ASP-DAC Jia-Xian Chen, Shi-Tang Liu, Yu-Tsung Wu, Mu-Ting Wu, Chien-Mo James Li, Norman Chang, Ying-Shiun Li, Wentze Chuang
2021	—	`conf`	Chip Performance Prediction Using Machine Learning Techniques. VLSI-DAT Min-Yan Su, Wei-Chen Lin, Yen-Ting Kuo, Chien-Mo James Li, Eric Jia-Wei Fang, Sung S.-Y. Hsueh
2021	J	`jnl`	Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits. J. Electron. Test. Tsai-Chieh Chen, Chia-Cheng Pai, Yi-Zhan Hsieh, Hsiao-Yin Tseng, Chien-Mo James Li, Tsung-Te Liu, I-Wei Chiu
2020	—	`conf`	Automatic IR-Drop ECO Using Machine Learning. ITC-Asia Heng-Yi Lin, Yen-Chun Fang, Shi-Tang Liu, Jia-Xian Chen, Chien-Mo James Li, Eric Jia-Wei Fang
2018	Misc	`conf`	IR drop prediction of ECO-revised circuits using machine learning. VTS Shih-Yao Lin, Yen-Chun Fang, Yu-Ching Li, Yu-Cheng Liu, Tsung-Shan Yang, Shang-Chien Lin, Chien-Mo James Li, Eric Jia-Wei Fang
2018	A	`conf`	Machine-learning-based dynamic IR drop prediction for ECO. ICCAD Yen-Chun Fang, Heng-Yi Lin, Min-Yan Su, Chien-Mo James Li, Eric Jia-Wei Fang
2017	A*	`conf`	Test Methodology for Dual-rail Asynchronous Circuits. DAC Kuan-Yen Huang, Ting-Yu Shen, Chien-Mo James Li
2013	A	`conf`	Automatic test pattern generation for delay defects using timed characteristic functions. ICCAD Shin-Yann Ho, Shuo-Ren Lin, Ko-Lung Yuan, Chien-Yen Kuo, Kuan-Yu Liao, Jie-Hong R. Jiang, Chien-Mo James Li
2011	J	`jnl`	Placement Optimization of Flexible TFT Digital Circuits. IEEE Des. Test Comput. Chester Liu, En-Hua Ma, Wen-En Wei, Chien-Mo James Li, I-Chun Cheng, Yung-Hui Yeh
2010	J	`jnl`	DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In. IEEE Trans. Very Large Scale Integr. Syst. Wei-Chung Kao, Wei-Shun Chuang, Shiu-Ting Lin, Chien-Mo James Li, Vasco Manquinho
2009	—	`conf`	Fault modeling and testing of retention flip-flops in low power designs. ASP-DAC Bing-Chuan Bai, Augusli Kifli, Chien-Mo James Li, Kun-Cheng Wu
2009	A	`conf`	Power scan: DFT for power switches in VLSI designs. ITC Bing-Chuan Bai, Chien-Mo James Li, Augusli Kifli, Even Tsai, Kun-Cheng Wu
2009	A	`conf`	Very-Low-Voltage testing of amorphous silicon TFT circuits. ITC Shiue-Tsung Shen, Wei-Hsiao Liu, Chien-Mo James Li, I-Chun Cheng
2005	J	`jnl`	Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Chien-Mo James Li, Edward J. McCluskey
2005	Misc	`conf`	Jump Scan: A DFT Technique for Low Power Testing. VTS Min-Hao Chiu, Chien-Mo James Li
2004	Misc	`conf`	ELF-Murphy Data on Defects and Test Sets. VTS Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra
2002	Misc	`conf`	Diagnosis of Sequence-Dependent Chips. VTS Chien-Mo James Li, Edward J. McCluskey
2001	Misc	`conf`	Diagnosis of Tunneling Opens. VTS Chien-Mo James Li, Edward J. McCluskey
2001	A	`conf`	Testing for resistive opens and stuck opens. ITC Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
2000	A	`conf`	Testing for tunneling opens. ITC Chien-Mo James Li, Edward J. McCluskey
1998	A	`conf`	Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey