| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | — | conf |
GCCE
|
| 2024 | — | conf |
GCCE
|
| 2024 | — | conf |
APCCAS
|
| 2023 | — | conf |
GCCE
|
| 2023 | — | conf |
GCCE
|
| 2023 | — | conf |
GCCE
|
| 2022 | J | jnl |
Remote. Sens.
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | — | conf |
GCCE
|
| 2018 | — | conf |
A-SSCC
|
| 2018 | — | conf |
VLSI-DAT
|
| 2018 | — | conf |
GCCE
|
| 2018 | — | conf |
GCCE
|
| 2017 | — | conf |
VLSI-DAT
|
| 2017 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2017 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2016 | — | conf |
A testable and debuggable dual-core system with thermal-aware dynamic voltage and frequency scaling.
ASP-DAC
|
| 2016 | — | conf |
GCCE
|
| 2015 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | — | conf |
VLSI-DAT
|
| 2014 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | — | conf |
VLSI-DAT
|
| 2013 | — | conf |
CICC
|
| 2013 | — | conf |
VLSI-DAT
|
| 2012 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2011 | — | conf |
A-SSCC
|
| 2011 | J | jnl |
IET Circuits Devices Syst.
|
| 2010 | J | jnl |
IET Circuits Devices Syst.
|
| 2009 | C | conf |
ISCAS
|
| 2009 | C | conf |
ISCAS
|
| 2008 | J | jnl |
IEICE Trans. Electron.
|
| 2008 | — | conf |
APCCAS
|