| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Grey Syst. Theory Appl.
|
| 2025 | J | jnl |
Comput. Electron. Agric.
|
| 2024 | — | conf |
BSCI
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
I-DO
|
| 2023 | J | jnl |
J. Inf. Sci. Eng.
|
| 2023 | — | conf |
APSIPA ASC
|
| 2022 | J | jnl |
Soc. Netw. Anal. Min.
|
| 2021 | J | jnl |
Grey Syst. Theory Appl.
|
| 2021 | — | conf |
IEEE BigData
|
| 2021 | J | jnl |
Int. J. Grid High Perform. Comput.
|
| 2021 | — | conf |
HCI (10)
|
| 2021 | J | jnl |
Entropy
|
| 2020 | J | jnl |
Comput. Ind. Eng.
|
| 2020 | J | jnl |
Secur. Commun. Networks
|
| 2019 | J | jnl |
J. Supercomput.
|
| 2019 | — | conf |
IIAI-AAI
|
| 2019 | — | conf |
NetFlowTotal: A Cloud Service Integration Platform for Malicious Traffic Analysis and Collaboration.
ICCBD
|
| 2019 | J | jnl |
Soft Comput.
|
| 2018 | — | conf |
DSC
|
| 2018 | B | conf |
SMC
|
| 2018 | J | jnl |
Cybern. Syst.
|
| 2018 | J | jnl |
Decis. Support Syst.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | — | conf |
ICCNS
|
| 2017 | J | jnl |
Sensors
|
| 2017 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2017 | — | conf |
BigDataService
|
| 2017 | J | jnl |
Int. J. Prod. Res.
|
| 2015 | J | jnl |
Appl. Math. Comput.
|
| 2015 | J | jnl |
J. Oper. Res. Soc.
|
| 2015 | — | conf |
VLSI-DAT
|
| 2015 | — | conf |
COMPSAC Workshops
|
| 2015 | — | conf |
BigData Congress
|
| 2015 | — | conf |
AINA Workshops
|
| 2015 | — | conf |
PAAP
|
| 2015 | — | conf |
VLSI-DAT
|
| 2015 | — | conf |
ICCST
|
| 2014 | J | jnl |
Comput. Ind. Eng.
|
| 2014 | J | jnl |
Neurocomputing
|
| 2014 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2014 | A* | conf |
DAC
|
| 2014 | J | jnl |
Neurocomputing
|
| 2014 | A* | conf |
DAC
|
| 2014 | — | conf |
PAKDD (2)
|
| 2013 | — | conf |
IEEE BigData
|
| 2013 | — | conf |
VLSI-DAT
|
| 2013 | — | conf |
IEEE BigData
|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2012 | J | jnl |
IEEE Trans. Knowl. Data Eng.
|
| 2012 | — | conf |
IEEE CLOUD
|
| 2012 | J | jnl |
Determining manufacturing parameters to suppress system variance using linear and non-linear models.
Expert Syst. Appl.
|
| 2012 | J | jnl |
IEEE Trans. Computers
|
| 2011 | J | jnl |
J. Signal Process. Syst.
|
| 2011 | J | jnl |
Comput. Geosci.
|
| 2011 | J | jnl |
Microprocess. Microsystems
|
| 2010 | J | jnl |
Concurr. Comput. Pract. Exp.
|
| 2009 | A* | conf |
DAC
|
| 2008 | — | conf |
AINA Workshops
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2006 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 1997 | — | conf |
ICIP (3)
|
| 1988 | C | conf |
ICCD
|