| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2015 | — | conf |
IEEM
|
| 2015 | — | conf |
IEEM
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2007 | J | jnl |
Int. J. Technol. Manag.
|
| 2006 | J | jnl |
Inf. Softw. Technol.
|
| 2005 | J | jnl |
Inf. Sci.
|
| 2004 | J | jnl |
Focus groups: impact of quality and process capability factors on the silicon wafer slicing process.
Int. J. Manuf. Technol. Manag.
|
| 2004 | J | jnl |
Stat. Comput.
|
| 1997 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part B
|
| 1997 | J | jnl |
Int. J. Uncertain. Fuzziness Knowl. Based Syst.
|
| 1997 | J | jnl |
Fuzzy Sets Syst.
|