| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
Ind. Manag. Data Syst.
|
| 2024 | J | jnl |
Int. J. Prod. Res.
|
| 2021 | J | jnl |
Comput. Ind. Eng.
|
| 2018 | J | jnl |
Comput. Ind. Eng.
|
| 2018 | J | jnl |
Int. J. Comput. Intell. Syst.
|
| 2016 | J | jnl |
Comput. Ind. Eng.
|
| 2015 | J | jnl |
Comput. Oper. Res.
|
| 2014 | J | jnl |
J. Intell. Manuf.
|
| 2014 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2013 | J | jnl |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole.
Comput. Ind. Eng.
|
| 2012 | J | jnl |
J. Intell. Manuf.
|
| 2011 | Misc | conf |
WSC
|
| 2011 | J | jnl |
J. Intell. Manuf.
|
| 2006 | J | jnl |
J. Intell. Manuf.
|