| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | C | conf |
ISITA
|
| 2021 | J | jnl |
Diagnosis for Reconfigurable Single-Electron Transistor Arrays with a More Generalized Defect Model.
ACM J. Emerg. Technol. Comput. Syst.
|
| 2019 | — | conf |
SoCC
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | A | conf |
DATE
|
| 2018 | A | conf |
DATE
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | — | conf |
VLSI-DAT
|
| 2017 | — | conf |
NEMS
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | — | conf |
ASP-DAC
|
| 2016 | C | conf |
ISCC
|
| 2015 | C | conf |
ISCC
|
| 2014 | A | conf |
ICS
|
| 2014 | B | conf |
SMARTCOMP
|
| 2013 | C | conf |
PDCAT
|