| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
DCIS
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2021 | J | jnl |
J. Electron. Test.
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
ITC-Asia
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | — | conf |
VLSI-DAT
|
| 2020 | — | conf |
IRC
|
| 2020 | — | conf |
ICCE-TW
|
| 2020 | — | conf |
ATS
|
| 2019 | — | conf |
3DIC
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | — | conf |
DFT
|
| 2019 | — | conf |
ASP-DAC
|
| 2018 | — | conf |
ISOCC
|
| 2018 | J | jnl |
Sensors
|
| 2015 | — | conf |
ICCE-TW
|
| 2014 | — | conf |
A-SSCC
|