| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
MedInfo
|
| 2017 | — | conf |
VLSI-DAT
|
| 2014 | — | conf |
VLSI-DAT
|
| 2014 | A | conf |
DATE
|
| 2013 | — | conf |
VLSI-DAT
|
| 2012 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part C
|
| 2012 | J | jnl |
Int. J. Image Graph.
|
| 2012 | — | conf |
VLSI-DAT
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2009 | A | conf |
ITC
|
| 2009 | J | jnl |
Appl. Soft Comput.
|
| 2007 | — | conf |
ATS
|
| 2004 | J | jnl |
Int. J. Commun. Syst.
|
| 2003 | J | jnl |
IEEE Trans. Reliab.
|
| 2003 | J | jnl |
Wirel. Commun. Mob. Comput.
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | — | conf |
DELTA
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2001 | A* | conf |
DAC
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | A | conf |
ICCAD
|
| 2000 | Misc | conf |
VTS
|
| 2000 | J | jnl |
IEEE J. Solid State Circuits
|
| 2000 | J | jnl |
VLSI Design
|
| 1999 | J | jnl |
IEEE Des. Test Comput.
|
| 1999 | — | conf |
DFT
|
| 1999 | — | conf |
ASP-DAC
|