| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
EDE-Distill: Boosting Event-Based Monocular Depth Estimation Performance via Knowledge Distillation.
IEEE Robotics Autom. Lett.
|
| 2025 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2025 | A* | conf |
ICLR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Comput. Electron. Agric.
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
VLSI Technology and Circuits
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Comput. Electron. Agric.
|
| 2023 | — | conf |
VLSI Technology and Circuits
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | — | conf |
DRC
|
| 2022 | — | conf |
DRC
|
| 2022 | — | conf |
VLSI Technology and Circuits
|
| 2021 | J | jnl |
J. Vis. Commun. Image Represent.
|
| 2020 | J | jnl |
Proc. IEEE
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Comput. Electron. Agric.
|
| 2020 | J | jnl |
Image Vis. Comput.
|
| 2020 | — | conf |
DRC
|
| 2020 | J | jnl |
Proc. IEEE
|
| 2019 | — | conf |
CICC
|
| 2019 | J | jnl |
Comput. Electron. Agric.
|
| 2019 | J | jnl |
Comput. Electron. Agric.
|
| 2017 | A | conf |
ISLPED
|
| 2017 | Misc | conf |
VLSID
|
| 2016 | J | jnl |
Microelectron. J.
|
| 2015 | — | conf |
ESSCIRC
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | J | jnl |
IEEE Access
|
| 2013 | — | conf |
ESSDERC
|
| 2012 | — | conf |
CICC
|
| 2012 | — | conf |
ESSCIRC
|
| 2012 | — | conf |
ESSCIRC
|
| 2011 | — | book |
|
| 2011 | A* | conf |
DAC
|
| 2010 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | J | jnl |
Sci. China Ser. F Inf. Sci.
|
| 2005 | — | conf |
ISQED
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2004 | — | conf |
ISQED
|
| 2004 | — | conf |
CICC
|
| 2003 | — | conf |
CICC
|
| 2003 | — | conf |
CICC
|
| 2003 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | J | jnl |
Proc. IEEE
|
| 2003 | J | jnl |
IEEE J. Solid State Circuits
|
| 2003 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2003 | J | jnl |
IEEE J. Solid State Circuits
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 2002 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2002 | — | conf |
ASP-DAC/VLSI Design
|
| 2002 | — | conf |
CICC
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | — | conf |
ISQED
|
| 2001 | J | jnl |
IEEE J. Solid State Circuits
|
| 2001 | — | conf |
ISQED
|
| 2001 | J | jnl |
IEEE J. Solid State Circuits
|
| 2001 | — | conf |
CICC
|
| 2001 | J | jnl |
Sci. China Ser. F Inf. Sci.
|
| 2000 | J | jnl |
IEEE J. Solid State Circuits
|
| 2000 | — | conf |
CICC
|
| 2000 | A | conf |
ICCAD
|
| 2000 | A | conf |
ICCAD
|
| 2000 | — | conf |
CICC
|
| 1999 | J | jnl |
IEEE J. Solid State Circuits
|
| 1999 | A* | conf |
DAC
|
| 1999 | J | jnl |
Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates.
IEEE J. Solid State Circuits
|
| 1998 | A* | conf |
DAC
|
| 1998 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1998 | — | conf |
CICC
|
| 1998 | J | jnl |
IEEE J. Solid State Circuits
|
| 1998 | J | jnl |
IEEE J. Solid State Circuits
|
| 1998 | — | conf |
CICC
|
| 1997 | A | conf |
ISLPED
|
| 1996 | A | conf |
ISLPED
|
| 1994 | J | jnl |
IEEE J. Solid State Circuits
|
| 1993 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1993 | J | jnl |
Proc. IEEE
|
| 1992 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1992 | J | jnl |
IEEE J. Solid State Circuits
|
| 1991 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1991 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1989 | C | conf |
ICCD
|