| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification.
ACM Trans. Knowl. Discov. Data
|
| 2023 | J | jnl |
J. Intell. Manuf.
|
| 2022 | J | jnl |
CoRR
|
| 2020 | J | jnl |
J. Intell. Manuf.
|
| 2014 | — | conf |
BigComp
|
| 2012 | — | conf |
ICHIT (2)
|
| 2011 | — | conf |
ICHIT (2)
|
| 2011 | — | conf |
iCAST
|
| 2011 | — | conf |
iCAST
|
| 2010 | C | conf |
CIT
|
| 2009 | — | conf |
ITNG
|
| 2008 | C | conf |
CIT
|
| 2008 | — | conf |
BMEI (1)
|