Chen Wang

22 papers A 10B 1Misc 2Journal 6Unranked 3
YearRankTypeTitle / Venue / Authors
2022 Misc conf
Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations.
VTS
Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy
2022 J jnl
Efficient Test Compression Configuration Selection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski
2020 J jnl
Low Cost Hypercompression of Test Data.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang
2020 A conf
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations.
ITC
Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada
2019 — conf
TEA: A Test Generation Algorithm for Designs with Timing Exceptions.
ATS
Naixing Wang, Chen Wang, Kun-Han Tsai, Wu-Tung Cheng, Xijiang Lin, Mark Kassab, Irith Pomeranz
2018 A conf
Hypercompression of Test Patterns.
ITC
Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang
2017 J jnl
Trimodal Scan-Based Test Paradigm.
IEEE Trans. Very Large Scale Integr. Syst.
Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang
2015 J jnl
Isometric Test Data Compression.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang
2015 — conf
TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm.
ATS
Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang
2014 A conf
Isometric test compression with low toggling activity.
ITC
Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang
2013 A conf
On the generation of compact test sets.
ITC
Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Chen Wang
2007 J jnl
Isolation of Failing Scan Cells through Convolutional Test Response Compaction.
J. Electron. Test.
Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer
2006 — conf
Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.
ATS
Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo
2005 B conf
Convolutional compaction-driven diagnosis of scan failures.
ETS
Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang
2005 A conf
Defect Aware Test Patterns.
DATE
Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz
2005 J jnl
Finite memory test response compactors for embedded test applications.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy
2005 Misc conf
On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios.
VLSI Design
Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz
2004 A conf
Fault Diagnosis in Designs with Convolutional Compactors.
ITC
Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski
2003 A conf
Convolutional Compaction of Test Responses.
ITC
Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy
2003 A conf
On Compacting Test Response Data Containing Unknown Values.
ICCAD
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Jerzy Tyszer
2002 A conf
Conflict driven techniques for improving deterministic test pattern generation.
ICCAD
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski
2001 A conf
REDI: An Efficient Fault Oriented Procedure to Identify Redundant Faults in Combinational Logic Circuits.
ICCAD
Chen Wang, Irith Pomeranz, Sudhakar M. Reddy