| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 1997 | J | jnl |
IEEE Trans. Computers
|
| 1996 | J | jnl |
J. Electron. Test.
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1995 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1994 | A | conf |
ITC
|
| 1994 | — | conf |
EDAC-ETC-EUROASIC
|
| 1994 | A | conf |
ICCAD
|
| 1992 | J | jnl |
IEEE Trans. Computers
|
| 1992 | A | conf |
ICCAD
|
| 1991 | A* | conf |
DAC
|
| 1990 | A | conf |
ICCAD
|
| 1989 | A* | conf |
DAC
|
| 1988 | A* | conf |
DAC
|