Chee Lip Gan

28 papers C 2Journal 19Unranked 7
YearRankTypeTitle / Venue / Authors
2024 J jnl
A Comprehensive Data Retrieval and Correction Approach From 40-nm Flash Memory With Selective Chemical Engraving.
IEEE Trans. Inf. Forensics Secur.
Xiao Mei Zeng, Qing Liu, Chee Lip Gan
2024 — conf
A Security Assessment of Protected Execute-Only Firmware in Microcontrollers Through Selective Chemical Engraving.
HOST
Xiaomei Zeng, Qing Liu, Samuel Chef, Chee Lip Gan
2024 C conf
Explainable automated data estimation in Logic State Imaging of embedded SRAM.
ISCAS
Samuel Chef, Chung Tah Chua, Jing Yun Tay, Chee Lip Gan
2022 C conf
Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU.
FDTC
Samuel Chef, Chung Tah Chua, Jing Yun Tay, Jason Cheah, Chee Lip Gan
2022 J jnl
Selective Staining on Non-Volatile Memory Cells for Data Retrieval.
IEEE Trans. Inf. Forensics Secur.
Xiao Mei Zeng, Qing Liu, Jing Yun Tay, Chee Lip Gan
2018 J jnl
Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab.
Wardhana A. Sasangka, Yu Gao, Chee Lip Gan, Carl V. Thompson
2017 J jnl
Characterisation of defects generated during constant current InGaN-on-silicon LED operation.
Microelectron. Reliab.
Riko I. Made, Yu Gao, Govindo J. Syaranamual, Wardhana A. Sasangka, L. Zhang, Xuan Sang Nguyen, Yee Yan Tay, Jason Scott Herrin, Carl V. Thompson, Chee Lip Gan
2017 J jnl
Extensive Laser Fault Injection Profiling of 65 nm FPGA.
J. Hardw. Syst. Secur.
Jakub Breier, Wei He, Shivam Bhasin, Dirmanto Jap, Samuel Chef, Hock Guan Ong, Chee Lip Gan
2017 J jnl
Improved reliability of AlGaN/GaN-on-Si high electron mobility transistors (HEMTs) with high density silicon nitride passivation.
Microelectron. Reliab.
Wardhana A. Sasangka, Govindo J. Syaranamual, Y. Gao, Riko I. Made, Chee Lip Gan, Carl V. Thompson
2016 J jnl
Atmospheric corrosion resistance of electroplated Ni/Ni-P/Au electronic contacts.
Microelectron. Reliab.
Vinod K. Murugan, Zhigang Jia, Govindo J. Syaranamual, Chee Lip Gan, Yizhong Huang, Zhong Chen
2016 — conf
Comprehensive Laser Sensitivity Profiling and Data Register Bit-Flips for Cryptographic Fault Attacks in 65 Nm FPGA.
SPACE
Wei He, Jakub Breier, Shivam Bhasin, Dirmanto Jap, Hock Guan Ong, Chee Lip Gan
2016 J jnl
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop.
Microelectron. Reliab.
Chung Tah Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan
2016 J jnl
Evaluation of the corrosion performance of Cu-Al intermetallic compounds and the effect of Pd addition.
Microelectron. Reliab.
Adeline B. Y. Lim, Wei Jian Neo, Oranna Yauw, Bob Chylak, Chee Lip Gan, Zhong Chen
2016 J jnl
Interfacial evolution and bond reliability in thermosonic Pd coated Cu wire bonding on aluminum metallization: Effect of palladium distribution.
Microelectron. Reliab.
Adeline B. Y. Lim, Chris B. Boothroyd, Oranna Yauw, Bob Chylak, Chee Lip Gan, Zhong Chen
2016 J jnl
Role of two-dimensional electron gas (2DEG) in AlGaN/GaN high electron mobility transistor (HEMT) ON-state degradation.
Microelectron. Reliab.
Govindo J. Syaranamual, Wardhana A. Sasangka, Riko I. Made, Subramaniam Arulkumaran, Geok Ing Ng, Siew Chuen Foo, Chee Lip Gan, Carl V. Thompson
2015 — conf
Copper micro and nano particles mixture for 3D interconnections application.
3DIC
Yuan Yuan Dai, Mei Zhen Ng, P. Anantha, Chee Lip Gan, Chuan Seng Tan
2015 — conf
Origin of physical degradation in AlGaN/GaN on Si high electron mobility transistors under reverse bias stressing.
IRPS
Wardhana A. Sasangka, Govindo J. Syaranamual, Chee Lip Gan, Carl V. Thompson
2015 J jnl
Unsupervised learning for signal mapping in dynamic photon emission.
Microelectron. Reliab.
Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak, Chee Lip Gan
2014 J jnl
Customized glass sealant for ceramic substrates for high temperature electronic application.
Microelectron. Reliab.
Ahmed Sharif, Chee Lip Gan, Zhong Chen
2014 J jnl
Ultra-fine pitch palladium-coated copper wire bonding: Effect of bonding parameters.
Microelectron. Reliab.
Adeline B. Y. Lim, Andrew C. K. Chang, Oranna Yauw, Bob Chylak, Chee Lip Gan, Zhong Chen
2013 J jnl
Bidirectional electromigration failure.
Microelectron. Reliab.
M. K. Lim, Vassilios A. Chouliaras, Chee Lip Gan, Vincent M. Dwyer
2013 J jnl
Electrical behavior of Au-Ge eutectic solder under aging for solder bump application in high temperature Electronics.
Microelectron. Reliab.
F. L. Lau, Riko I. Made, Wahyuaji Narottama Putra, J. Z. Lim, V. C. Nachiappan, J. L. Aw, Chee Lip Gan
2012 J jnl
Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress.
Microelectron. Reliab.
Meng Keong Lim, Jingyuan Lin, Yong Chiang Ee, Chee Mang Ng, Jun Wei, Chee Lip Gan
2011 J jnl
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization.
Microelectron. Reliab.
Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis
2011 — conf
Numerical and experimental study on Cu protrusion of Cu-filled through-silicon vias (TSV).
3DIC
Fa Xing Che, Wahyuaji Narottama Putra, A. Heryanto, A. Trigg, S. Gao, Chee Lip Gan
2007 J jnl
Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations.
Microelectron. J.
Syed M. Alam, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel
2005 — conf
Electromigration Reliability Comparison of Cu and Al Interconnects.
ISQED
Syed M. Alam, Frank L. Wei, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel
2004 — conf
Circuit Level Reliability Analysis of Cu Interconnects.
ISQED
Syed M. Alam, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel