Chase Cook

15 papers A* 1A 2Journal 8Unranked 3
YearRankTypeTitle / Venue / Authors
2021 J jnl
Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Xiaoyi Wang, Shaobin Ma, Sheldon X.-D. Tan, Chase Cook, Liang Chen, Jianlei Yang, Wenjian Yu
2019 J jnl
GPU-based Ising Computing for Solving Balanced Min-Cut Graph Partitioning Problem.
CoRR
Chase Cook, Wentian Jin, Sheldon X.-D. Tan
2019 J jnl
GPU-based Ising computing for solving max-cut combinatorial optimization problems.
Integr.
Chase Cook, Hengyang Zhao, Takashi Sato, Masayuki Hiromoto, Sheldon X.-D. Tan
2019 J jnl
Reliability based hardware Trojan design using physics-based electromigration models.
Integr.
Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan
2019 — —
Simulation for Reliability, Hardware Security, and Ising Computing in VLSI Chip Design.
Chase Cook
2018 — conf
Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires.
SMACD
Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun, Sheldon X.-D. Tan
2018 J jnl
Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy.
Integr.
Taeyoung Kim, Sheldon X.-D. Tan, Chase Cook, Zeyu Sun
2018 J jnl
Fast Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Chase Cook, Sheldon X.-D. Tan
2018 J jnl
Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method.
IEEE Trans. Very Large Scale Integr. Syst.
Chase Cook, Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Sheldon X.-D. Tan
2018 J jnl
Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited).
Integr.
Sheldon X.-D. Tan, Hussam Amrouch, Taeyoung Kim, Zeyu Sun, Chase Cook, Jörg Henkel
2018 — conf
Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models.
SMACD
Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan
2017 A conf
Fast physics-based electromigration analysis for multi-branch interconnect trees.
ICCAD
Xiaoyi Wang, Yan Yan, Jian He, Sheldon X.-D. Tan, Chase Cook, Shengqi Yang
2016 A conf
Dynamic reliability management for near-threshold dark silicon processors.
ICCAD
Taeyoung Kim, Zeyu Sun, Chase Cook, Jagadeesh Gaddipati, Hai Wang, Hai-Bao Chen, Sheldon X.-D. Tan
2016 — conf
Finite difference method for electromigration analysis of multi-branch interconnects.
SMACD
Chase Cook, Zeyu Sun, Taeyoung Kim, Sheldon X.-D. Tan
2016 A* conf
Invited - Cross-layer modeling and optimization for electromigration induced reliability.
DAC
Taeyoung Kim, Zeyu Sun, Chase Cook, Hengyang Zhao, Ruiwen Li, Daniel Wong, Sheldon X.-D. Tan