Charles S. Whitman

13 papers Journal 13
YearRankTypeTitle / Venue / Authors
2017 J jnl
Determination of safe reliability region over temperature and current density for through wafer vias.
Microelectron. Reliab.
Charles S. Whitman, Michael G. Meeder, Peter J. Zampardi
2014 J jnl
Methodology for predicting off-state reliability in GaN power transistors.
Microelectron. Reliab.
Charles S. Whitman
2012 J jnl
Impact of ambient temperature set point deviation on Arrhenius estimates.
Microelectron. Reliab.
Charles S. Whitman
2009 J jnl
Prediction of transmission line lifetimes over temperature and current density.
Microelectron. Reliab.
Charles S. Whitman
2008 J jnl
Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices.
Microelectron. Reliab.
Leslie Marchut, Charles S. Whitman
2008 J jnl
Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method.
Microelectron. Reliab.
Charles S. Whitman
2007 J jnl
Defining the safe operating area for HBTs with an InGaP emitter across temperature and current density.
Microelectron. Reliab.
Charles S. Whitman
2006 J jnl
Determining factors affecting ESD failure voltage using DOE.
Microelectron. Reliab.
Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell
2006 J jnl
Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237].
Microelectron. Reliab.
Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell
2006 J jnl
Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271].
Microelectron. Reliab.
Charles S. Whitman
2006 J jnl
Reliability results of HBTs with an InGaP emitter.
Microelectron. Reliab.
Charles S. Whitman
2005 J jnl
Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method.
Microelectron. Reliab.
Charles S. Whitman, Michael Meeder
2003 J jnl
Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares.
Microelectron. Reliab.
Charles S. Whitman