Charles R. Kime

37 papers A 12C 1Misc 2Journal 21Unranked 1

Year	Rank	Type	Title / Venue / Authors
1997	J	`jnl`	Cellular Automata for Weighted Random Pattern Generation. IEEE Trans. Computers Danial J. Neebel, Charles R. Kime
1996	A	`conf`	MFBIST: A BIST Method for Random Pattern Resistant Circuits. ITC Mohammed F. AlShaibi, Charles R. Kime
1995	J	`jnl`	Partial scan flip-flop selection by use of empirical testability. J. Electron. Test. Kee Sup Kim, Charles R. Kime
1994	A	`conf`	Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. ITC Mohammed F. AlShaibi, Charles R. Kime
1994	Misc	`conf`	ICAT: incremental combinational ATPG. VTS Byung S. So, Charles R. Kime
1994	Misc	`conf`	Multiple weighted cellular automata. VTS Danial J. Neebel, Charles R. Kime
1993	J	`jnl`	A Tutorial on Built-In Self-Test, Part 2: Applications. IEEE Des. Test Comput. Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja
1993	J	`jnl`	A Tutorial on Built-in Self-Test. I. Principles. IEEE Des. Test Comput. Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja
1993	J	`jnl`	A fault simulation method: Parallel pattern critical path tracing. J. Electron. Test. Byung S. So, Charles R. Kime
1993	A	`conf`	Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. ITC Danial J. Neebel, Charles R. Kime
1993	A	`conf`	Partial Scan Using Reverse Direction Empirical Testability. ITC Kee Sup Kim, Charles R. Kime
1992	J	`jnl`	Test Scheduling in High Performance VLSI System Implementations. IEEE Trans. Computers John Y. Sayah, Charles R. Kime
1990	A	`conf`	Computer-aided design of pseudoexhaustive BIST for semiregular circuits. ITC Chau-Chin Su, Charles R. Kime
1990	A	`conf`	Multiple path sensitization for hierarchical circuit testing. ITC Chau-Chin Su, Charles R. Kime
1990	A	`conf`	Partial Scan by Use of Empirical Testability. ICCAD Kee Sup Kim, Charles R. Kime
1989	C	`conf`	Scheduling unequal length tests in high performance VLSI system implementations. ICCD John Y. Sayah, Charles R. Kime
1988	A	`conf`	: Test Scheduling for High Performance VLSI System Implementations. ITC John Y. Sayah, Charles R. Kime
1988	J	`jnl`	A concurrent testing technique for digital circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Kewal K. Saluja, Rajiv Sharma, Charles R. Kime
1988	A	`conf`	Concurrent Off-Phase Built-in Self-Test of Dormant Logic. ITC Leon J. Sigal, Charles R. Kime
1988	A	`conf`	Impact of Testability Standards on University Research and Instruction. ITC Charles R. Kime
1988	J	`jnl`	Test Scheduling and Control for VLSI Built-In Self-Test. IEEE Trans. Computers Gary L. Craig, Charles R. Kime, Kewal K. Saluja
1985	A	`conf`	Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. ITC Gary L. Craig, Charles R. Kime
1984	A	`conf`	A Built-In Test Methodology for VLSI Data Paths. ITC Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams
1984	J	`jnl`	Diagnosis in the Presence of Known Faults. IEEE Trans. Computers John A. McPherson, Charles R. Kime
1982	—	`conf`	WISPAC: A Parallel Array Computer for Simulation Applications. IMACS World Congress Vincent C. Rideout, J. Eastman, Adel Said Elmaghraby, Raphael A. Finkel, A. A. Frank, T. J. Kaminsky, Charles R. Kime, John A. McPherson, Michael Jon Redmond, S. Diane Smith
1979	J	`jnl`	A Two-Level Diagnostic Model for Digital Systems. IEEE Trans. Computers John A. McPherson, Charles R. Kime
1979	J	`jnl`	An Abstract Model for Digital System Fault Diagnosis. IEEE Trans. Computers Charles R. Kime
1976	J	`jnl`	A Module-Level Testing Approach for Combinational Networks. IEEE Trans. Computers Ramachendra P. Batni, Charles R. Kime
1975	J	`jnl`	Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences". IEEE Trans. Computers Gernot Metze, Donald R. Schertz, Kilin To, Gordon Whitney, Charles R. Kime, Jeffrey D. Russell
1975	J	`jnl`	Fault Tolerant Computing: An Introduction and a Perspective. IEEE Trans. Computers Charles R. Kime
1975	J	`jnl`	System Fault Diagnosis: Closure and Diagnosability with Repair. IEEE Trans. Computers Jeffrey D. Russell, Charles R. Kime
1975	J	`jnl`	System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair. IEEE Trans. Computers Jeffrey D. Russell, Charles R. Kime
1974	J	`jnl`	An Efficient Algorithm for Finding an Irredundant Set Cover. J. ACM Ramachendra P. Batni, Jeffrey D. Russell, Charles R. Kime
1972	J	`jnl`	Improved Procedures for Determining Diagnostic Resolution. IEEE Trans. Computers James C. Bassett, Charles R. Kime
1971	J	`jnl`	Structural Factors in the Fault Diagnosis of Combinational Networks. IEEE Trans. Computers Jeffrey D. Russell, Charles R. Kime
1970	J	`jnl`	An Analysis Model for Digital System Diagnosis. IEEE Trans. Computers Charles R. Kime
1966	J	`jnl`	An organization for checking experiments on sequential circuits. IEEE Trans. Electron. Comput. Charles R. Kime