| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2026 | — | conf |
ASP-DAC
|
| 2025 | A | conf |
ICCAD
|
| 2025 | Misc | conf |
VTS
|
| 2025 | A | conf |
ITC
|
| 2025 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | A | conf |
ICCAD
|
| 2025 | — | conf |
ASP-DAC
|
| 2024 | J | jnl |
Veh. Commun.
|
| 2024 | A | conf |
ITC
|
| 2024 | A | conf |
ICCAD
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Future Gener. Comput. Syst.
|
| 2024 | Misc | conf |
VTS
|
| 2023 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2023 | A | conf |
ITC
|
| 2022 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2022 | B | conf |
NOMS
|
| 2022 | A | conf |
ITC
|
| 2022 | B | conf |
NOMS
|
| 2022 | J | jnl |
IEEE Trans. Computers
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
ACM Trans. Cyber Phys. Syst.
|
| 2022 | A* | conf |
DAC
|
| 2022 | — | conf |
VLSI-DAT
|
| 2022 | — | conf |
ITC-Asia
|
| 2021 | J | jnl |
A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability and Delay-Fault Testability.
ACM Trans. Design Autom. Electr. Syst.
|
| 2021 | — | conf |
ITC-Asia
|
| 2021 | A | conf |
DATE
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | — | conf |
CloudNet
|
| 2020 | — | conf |
VLSI-DAT
|
| 2020 | — | conf |
ITSC
|
| 2020 | A* | conf |
INFOCOM
|
| 2020 | — | conf |
ATS
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
IEEE J. Sel. Areas Commun.
|
| 2019 | A | conf |
ITC
|
| 2019 | — | conf |
NFV-SDN
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
NFV-SDN
|
| 2018 | J | jnl |
IET Circuits Devices Syst.
|
| 2018 | B | conf |
IWQoS
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2018 | — | conf |
ITC-Asia
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | A | conf |
ICCAD
|
| 2017 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2017 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2017 | — | conf |
NFV-SDN
|
| 2017 | B | conf |
GLOBECOM
|
| 2017 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2017 | — | conf |
ICOIN
|
| 2017 | — | conf |
ITC-Asia
|
| 2017 | — | conf |
ICC
|
| 2016 | — | conf |
ICOIN
|
| 2016 | A | conf |
DATE
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | — | conf |
NOF
|
| 2016 | — | conf |
ASP-DAC
|
| 2015 | J | jnl |
J. Electron. Test.
|
| 2015 | A | conf |
DATE
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | — | conf |
VLSI-DAT
|
| 2015 | — | conf |
CloudNet
|
| 2015 | — | conf |
ICC
|
| 2015 | A* | conf |
DAC
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | A* | conf |
DAC
|
| 2014 | B | conf |
ICPP
|
| 2014 | — | conf |
ICOIN
|
| 2014 | — | conf |
HPCC/CSS/ICESS
|
| 2014 | — | conf |
ASP-DAC
|
| 2014 | — | conf |
ISQED
|
| 2013 | — | conf |
VLSI-DAT
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2013 | — | conf |
CloudNet
|
| 2013 | — | conf |
EMC/HumanCom
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2013 | — | conf |
CloudCom (1)
|
| 2013 | A | conf |
DATE
|
| 2013 | — | conf |
ASP-DAC
|
| 2012 | — | conf |
ASP-DAC
|
| 2012 | B | conf |
GLOBECOM
|
| 2012 | J | jnl |
IET Comput. Digit. Tech.
|
| 2012 | — | conf |
VLSI-DAT
|
| 2012 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2010 | — | conf |
ISQED
|
| 2010 | C | conf |
ISCAS
|
| 2009 | — | conf |
MTV
|
| 2009 | A | conf |
ICCAD
|
| 2009 | A | conf |
ITC
|
| 2009 | A | conf |
ITC
|
| 2008 | — | conf |
MTV
|
| 2007 | A | conf |
ICCAD
|
| 2006 | — | conf |
Haifa Verification Conference
|
| 2006 | — | conf |
HLDVT
|
| 2006 | J | jnl |
IEEE Trans. Computers
|
| 2006 | C | conf |
ICCD
|
| 2005 | Misc | conf |
VTS
|
| 2005 | — | conf |
DFT
|
| 2005 | — | conf |
MTV
|
| 2005 | — | conf |
HLDVT
|
| 2005 | A | conf |
ITC
|