Charles F. Hawkins

40 papers A 24Misc 1Journal 13Unranked 2

Year	Rank	Type	Title / Venue / Authors
2013	J	`jnl`	Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. IEEE Des. Test Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez
2003	—	`conf`	A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. DFT Charles F. Hawkins, Ali Keshavarzi, Jaume Segura
2003	A	`conf`	Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
2003	—	`conf`	CMOS IC nanometer technology failure mechanisms. CICC Charles F. Hawkins, Ali Keshavarzi, Jaume Segura
2003	J	`jnl`	Multiple-parameter CMOS IC testing with increased sensitivity for I IEEE Trans. Very Large Scale Integr. Syst. Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De
2002	A	`conf`	Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
2002	J	`jnl`	Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins
2002	A	`conf`	Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins
2001	Misc	`conf`	Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
2000	J	`jnl`	Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. Very Large Scale Integr. Syst. Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins
2000	A	`conf`	Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De
1999	J	`jnl`	Deep Submicron CMOS Current IC Testing: Is There a Future? IEEE Des. Test Comput. Charles F. Hawkins, Jerry M. Soden
1999	A	`conf`	Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De
1999	J	`jnl`	Test and Reliability: Partners in IC Manufacturing, Part 1. IEEE Des. Test Comput. Charles F. Hawkins, Jaume Segura
1999	J	`jnl`	Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Des. Test Comput. Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin
1998	A	`conf`	CMOS IC reliability indicators and burn-in economics. ITC Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
1997	A	`conf`	Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins
1997	A	`conf`	Transient Power Supply Voltage (V ITC Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
1996	J	`jnl`	A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors. J. Electron. Test. Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins
1996	J	`jnl`	IDDQ Testing: Issues Present and Future. IEEE Des. Test Comput. Jerry M. Soden, Charles F. Hawkins
1995	A	`conf`	A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. ITC Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins
1995	J	`jnl`	IDDQ Design and Test Advantages Propel Industry. IEEE Des. Test Comput. Charles F. Hawkins, Jerry M. Soden
1994	A	`conf`	Defect Classes - An Overdue Paradigm for CMOS IC. ITC Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson
1993	A	`conf`	A General Purpose I ITC Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins
1993	A	`conf`	Quality Testing Requires Quality Thinking. ITC Jerry M. Soden, Charles F. Hawkins
1993	A	`conf`	The Economics of Guardband Placement. ITC Richard H. Williams, Charles F. Hawkins
1992	A	`conf`	Economic Impact of Type I Test Errors at System and Board Levels. ITC Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins
1992	J	`jnl`	IDDQ testing: A review. J. Electron. Test. Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao
1992	J	`jnl`	Introduction. J. Electron. Test. Ravi K. Gulati, Charles F. Hawkins
1992	A	`conf`	System Testing: The Future for All of Us. ITC Charles F. Hawkins
1992	A	`conf`	Testing Errors: Data and Calculations in an IC Manufacturing Process. ITC Richard H. Williams, R. Glenn Wagner, Charles F. Hawkins
1991	A	`conf`	EE Curriculum - Continuous Process Improvement? ITC Charles F. Hawkins, Richard H. Williams
1991	A	`conf`	The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. ITC Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins
1990	A	`conf`	Errors in testing. ITC Richard H. Williams, Charles F. Hawkins
1990	A	`conf`	Increased CMOS IC stuck-at fault coverage with reduced I ITC Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins
1990	A	`conf`	Zero defects or zero stuck-at faults-CMOS IC process improvement with I ITC Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins
1989	A	`conf`	CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins
1986	A	`conf`	Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. ITC Jerry M. Soden, Charles F. Hawkins
1986	J	`jnl`	Test Considerations for Gate Oxide Shorts in CMOS ICs. IEEE Des. Test Jerry M. Soden, Charles F. Hawkins
1985	A	`conf`	Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC Jerry M. Soden, Charles F. Hawkins