Charles E. Radke

13 papers A* 5A 4Journal 4
YearRankTypeTitle / Venue / Authors
1991 A* conf
Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits.
DAC
David M. Wu, Charles E. Radke
1986 A conf
Performance Assurance of Memories Embedded in VLSI Chips.
ITC
E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke
1986 A conf
Statistical AC Test Coverage.
ITC
David M. Wu, Charles E. Radke, J. Paul Roth
1984 A conf
Improve Yield and Quality Through Testability Analysis of VLSI Circuits.
ITC
David M. Wu, Charles E. Radke, C. C. Beh
1983 A* ed.
Proceedings of the 20th Design Automation Conference, DAC '83, Miami Beach, Florida, USA, June 27-29, 1983
DAC
Charles E. Radke
1983 A* conf
Quality level and fault coverage for multichip modules.
DAC
E. Kofi Vida-Torku, Charles E. Radke
1982 A conf
Do Stuck Fault Models Reflect Manufacturing Defects?
ITC
C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku
1982 A* ed.
Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982
DAC
James S. Crabbe, Charles E. Radke, Hillel Ofek
1970 J jnl
The use of quadratic residue research.
Commun. ACM
Charles E. Radke
1969 A* conf
A justification of, and an improvement on, a useful rule for predicting circuit-to-pin ratios.
DAC
Charles E. Radke
1966 J jnl
Merge-Sort Analysis by Matrix Techniques.
IBM Syst. J.
Charles E. Radke
1966 J jnl
Necessary and Sufficient Conditions on Conditional Probabilities to Maximize Entropy
Inf. Control.
Charles E. Radke
1965 J jnl
Enumeration of Strongly Connected Sequential Machines
Inf. Control.
Charles E. Radke