Chao-Wen Tseng

16 papers A 4Misc 6Journal 2Unranked 4
YearRankTypeTitle / Venue / Authors
2016 J jnl
A Design of GS1 EPCglobal Application Level Events Extension for IoT Applications.
IEICE Trans. Inf. Syst.
Chao-Wen Tseng, Yu-Chang Chen, Chua-Huang Huang
2014 — conf
A uniform EPC scheme design of IEEE 1451 transducers for IoT applications.
ICUFN
Chao-Wen Tseng, Chua-Huang Huang
2014 — conf
Adding IEEE 1451 Transducer Capability to EPCglobal Information Service.
iThings/GreenCom/CPSCom
Chao-Wen Tseng, Yi-Ting Liao, Chua-Huang Huang
2014 — conf
Extending EPCglobal ALE middleware to integrate transducer capability of IEEE 1451 standards.
ICUFN
Chao-Wen Tseng, Yu-Sheng Lin, Wei-Han Lu, Chua-Huang Huang
2012 — conf
Complex sensing event process of IoT application based on epcglobal architecture and IEEE 1451.
IOT
Chao-Wen Tseng, Chih-Ming Chang, Chua-Huang Huang
2008 J jnl
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners.
IEEE Trans. Instrum. Meas.
James Chien-Mo Li, Po-Chou Lin, Chih-Ming Chiang, Chuo-Jan Pan, Chao-Wen Tseng
2004 Misc conf
ELF-Murphy Data on Defects and Test Sets.
VTS
Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra
2002 Misc conf
Experimental Results for Slow-Speed Testing.
VTS
Chao-Wen Tseng, James Li, Edward J. McCluskey
2001 Misc conf
An Evaluation of Pseudo Random Testing for Detecting Real Defects.
VTS
Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson
2001 Misc conf
MINVDD Testing for Weak CMOS ICs.
VTS
Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh
2001 A conf
Multiple-output propagation transition fault test.
ITC
Chao-Wen Tseng, Edward J. McCluskey
2001 A conf
Testing for resistive opens and stuck opens.
ITC
Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
2000 Misc conf
Cold Delay Defect Screening.
VTS
Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu
2000 A conf
Stuck-fault tests vs. actual defects.
ITC
Edward J. McCluskey, Chao-Wen Tseng
1998 A conf
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.
ITC
Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
1998 Misc conf
Experimental Results for IDDQ and VLV Testing.
VTS
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey