Chao-Hsun Chen

13 papers A 1Misc 1Journal 5Unranked 6
YearRankTypeTitle / Venue / Authors
2022 — conf
Aging Impact of Power MOSFETs in Charger with Different Operation Frequency.
ATS
Kuan-Hsun Duh, Cheng-Wen Wu, Ming-Der Shieh, Chao-Hsun Chen, Ming-Yan Fan
2022 — conf
Battery Pack Reliability and Endurance Enhancement for Electric Vehicles by Dynamic Reconfiguration.
ATS
Yu-You Chou, Cheng-Wen Wu, Ming-Der Shieh, Chao-Hsun Chen
2015 — conf
A hybrid built-in self-test scheme for DRAMs.
VLSI-DAT
Chi-Chun Yang, Jin-Fu Li, Yun-Chao Yu, Kuan-Te Wu, Chih-Yen Lo, Chao-Hsun Chen, Jenn-Shiang Lai, Ding-Ming Kwai, Yung-Fa Chou
2014 — conf
BIST-Assisted Tuning Scheme for Minimizing IO-Channel Power of TSV-Based 3D DRAMs.
ATS
Yun-Chao You, Chi-Chun Yang, Jin-Fu Li, Chih-Yen Lo, Chao-Hsun Chen, Jenn-Shiang Lai, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu
2013 J jnl
Generalization of an Enhanced ECC Methodology for Low Power PSRAM.
IEEE Trans. Computers
Po-Yuan Chen, Chin-Lung Su, Chao-Hsun Chen, Cheng-Wen Wu
2010 J jnl
Built-In Self-Repair Schemes for Flash Memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu
2010 J jnl
Economic Analysis of the HOY Wireless Test Methodology.
IEEE Des. Test Comput.
Yu-Tsao Hsing, Li-Ming Denq, Chao-Hsun Chen, Cheng-Wen Wu
2008 J jnl
A Systematic Approach to Memory Test Time Reduction.
IEEE Des. Test Comput.
Jen-Chieh Yeh, Chao-Hsun Chen, Cheng-Wen Wu, Shuo-Fen Kuo
2007 J jnl
Economic Aspects of Memory Built-in Self-Repair.
IEEE Des. Test Comput.
Rei-Fu Huang, Chao-Hsun Chen, Cheng-Wen Wu
2006 Misc conf
A Built-In Self-Repair Scheme for NOR-Type Flash Memory.
VTS
Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu
2006 A conf
An Enhanced EDAC Methodology for Low Power PSRAM.
ITC
Po-Yuan Chen, Yi-Ting Yeh, Chao-Hsun Chen, Jen-Chieh Yeh, Cheng-Wen Wu, Jeng-Shen Lee, Yu-Chang Lin
2005 — conf
A systematic approach to reducing semiconductor memory test time in mass production.
MTDT
Jen-Chieh Yeh, Shyr-Fen Kuo, Cheng-Wen Wu, Chih-Tsun Huang, Chao-Hsun Chen
2005 — conf
Flash Memory Die Sort by a Sample Classification Method.
Asian Test Symposium
Yu-Chun Dawn, Jen-Chieh Yeh, Cheng-Wen Wu, Chia-Ching Wang, Yung-Chen Lin, Chao-Hsun Chen