| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
J. Ind. Inf. Integr.
|
| 2026 | J | jnl |
Neurocomputing
|
| 2026 | J | jnl |
Digit. Signal Process.
|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
Inf. Fusion
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2025 | J | jnl |
Knowl. Based Syst.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
Knowl. Based Syst.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
J. Intell. Manuf.
|
| 2025 | J | jnl |
Dynamic branch layer fusion: A new continual learning method for rotating machinery fault diagnosis.
Knowl. Based Syst.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Appl. Soft Comput.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | J | jnl |
Knowl. Based Syst.
|
| 2024 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2024 | J | jnl |
Knowl. Based Syst.
|
| 2024 | J | jnl |
Int. J. Robotics Res.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | J | jnl |
Knowl. Based Syst.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
Knowl. Based Syst.
|
| 2023 | J | jnl |
Graph embedding deep broad learning system for data imbalance fault diagnosis of rotating machinery.
Reliab. Eng. Syst. Saf.
|
| 2023 | J | jnl |
Int. J. Prod. Res.
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
Knowl. Based Syst.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | — | conf |
ICPHM
|
| 2022 | J | jnl |
Knowl. Based Syst.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | C | conf |
INDIN
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | C | conf |
INDIN
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
AIM
|
| 2019 | — | conf |
AIM
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Neurocomputing
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2017 | — | conf |
ICDLT
|
| 2017 | J | jnl |
IEEE Access
|
| 2016 | — | conf |
I2MTC
|
| 2014 | J | jnl |
Sensors
|
| 2013 | J | jnl |
Sensors
|