| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
A Novel Self-Correction Method for Linear Displacement Measurement Based on 2-D Synthesis Mechanism.
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | C | conf |
CLUSTER
|
| 2019 | J | jnl |
Sensors
|
| 2018 | C | conf |
CLUSTER
|
| 2018 | — | conf |
ICSAI
|
| 2015 | — | conf |
SpringSim (HPS)
|
| 2015 | — | conf |
ICA3PP (3)
|
| 2015 | C | conf |
IGARSS
|
| 2014 | — | conf |
ICA3PP (2)
|
| 2013 | — | conf |
HPCC/EUC
|
| 2010 | — | conf |
ICEE
|
| 2009 | — | conf |
CSIE (2)
|
| 2008 | — | conf |
CSSE (3)
|