| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEICE Electron. Express
|
| 2024 | J | jnl |
IEICE Electron. Express
|
| 2023 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2022 | J | jnl |
IEICE Electron. Express
|
| 2021 | J | jnl |
J. Circuits Syst. Comput.
|
| 2021 | J | jnl |
IEICE Electron. Express
|
| 2020 | J | jnl |
IEICE Electron. Express
|
| 2020 | J | jnl |
IEICE Electron. Express
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2016 | J | jnl |
IEICE Electron. Express
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Modeling and understanding of the frequency dependent HPM upset susceptibility of the CMOS inverter.
Sci. China Inf. Sci.
|
| 2012 | J | jnl |
J. Networks
|
| 2008 | J | jnl |
Microelectron. Reliab.
|