Chang-Chih Chen

21 papers A 1C 2Misc 2Journal 13Unranked 3
YearRankTypeTitle / Venue / Authors
2022 J jnl
Optimal decision of dynamic wealth allocation with life insurance for mitigating health risk under market incompleteness.
Eur. J. Oper. Res.
Chang-Chih Chen, Chia-Chien Chang, Edward W. Sun, Min-Teh Yu
2020 J jnl
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations.
IEEE Trans. Very Large Scale Integr. Syst.
Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor
2018 J jnl
Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors.
IEEE Trans. Emerg. Top. Comput.
Taizhi Liu, Chang-Chih Chen, Linda Milor
2016 J jnl
Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array.
IEEE Trans. Very Large Scale Integr. Syst.
Woongrae Kim, Chang-Chih Chen, Dae Hyun Kim, Linda Milor
2016 C conf
SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection.
ICCD
Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor
2016 J jnl
System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection.
IEEE Trans. Very Large Scale Integr. Syst.
Chang-Chih Chen, Taizhi Liu, Linda Milor
2015 — conf
Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines.
ISQED
Taizhi Liu, Chang-Chih Chen, Linda S. Milor
2015 J jnl
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems.
Microelectron. Reliab.
Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor
2015 — conf
Estimation of remaining life using embedded SRAM for wearout parameter extraction.
IWASI
Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor
2015 Misc conf
MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array.
VTS
Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor
2015 J jnl
Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms.
IEEE Trans. Very Large Scale Integr. Syst.
Chang-Chih Chen, Linda S. Milor
2015 J jnl
Processor-level reliability simulator for time-dependent gate dielectric breakdown.
Microprocess. Microsystems
Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor
2015 J jnl
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown.
Microelectron. Reliab.
Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor
2014 J jnl
Backend Dielectric Reliability Full Chip Simulator.
IEEE Trans. Very Large Scale Integr. Syst.
Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, Sung Kyu Lim
2014 Misc conf
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements.
VTS
Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor
2014 J jnl
Simulation of system backend dielectric reliability.
Microelectron. J.
Chang-Chih Chen, Muhammad Bashir, Linda S. Milor, Daehyun Kim, Sung Kyu Lim
2013 J jnl
Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysis.
Microelectron. Reliab.
Chang-Chih Chen, Fahad Ahmed, Linda Milor
2013 A conf
System-level modeling and microprocessor reliability analysis for backend wearout mechanisms.
DATE
Chang-Chih Chen, Linda Milor
2013 — conf
System-level modeling and reliability analysis of microprocessor systems.
IWASI
Chang-Chih Chen, Linda Milor
2012 C conf
A comparative study of wearout mechanisms in state-of-art microprocessors.
ICCD
Chang-Chih Chen, Fahad Ahmed, Linda Milor
2012 J jnl
Backend dielectric reliability simulator for microprocessor system.
Microelectron. Reliab.
Chang-Chih Chen, Fahad Ahmed, Dae Hyun Kim, Sung Kyu Lim, Linda Milor