Chandra Tirumurti

17 papers A 2B 2C 1Misc 2Journal 6Unranked 4
YearRankTypeTitle / Venue / Authors
2017 J jnl
Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST.
IEEE Trans. Very Large Scale Integr. Syst.
Martin Omaña, Daniele Rossi, Filippo Fuzzi, Cecilia Metra, Chandra Tirumurti, Rajesh Galivanche
2015 J jnl
Revisiting Vulnerability Analysis in Modern Microprocessors.
IEEE Trans. Computers
Michail Maniatakos, Maria K. Michael, Chandra Tirumurti, Yiorgos Makris
2014 — conf
Power droop reduction during Launch-On-Shift scan-based logic BIST.
DFT
Martin Omaña, Daniele Rossi, Edda Beniamino, Cecilia Metra, Chandra Tirumurti, Rajesh Galivanche
2013 B conf
Novel approach to reduce power droop during scan-based logic BIST.
ETS
Martin Omaña, Daniele Rossi, Filippo Fuzzi, Cecilia Metra, Chandra Tirumurti, R. Galivache
2012 J jnl
Functional Test-Sequence Grading at Register-Transfer Level.
IEEE Trans. Very Large Scale Integr. Syst.
Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti
2011 B conf
AVF Analysis Acceleration via Hierarchical Fault Pruning.
ETS
Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
2011 J jnl
Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller.
IEEE Trans. Computers
Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
2011 J jnl
Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor.
IEEE Trans. Computers
Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Chandra Tirumurti, Yiorgos Makris
2010 — conf
Low cost and low intrusive approach to test on-line the scheduler of high performance microprocessors.
Conf. Computing Frontiers
Daniele Rossi, Martin Omaña, Gianluca Berghella, Cecilia Metra, Abhijit Jas, Chandra Tirumurti, Rajesh Galivanche
2009 C conf
Impact analysis of performance faults in modern microprocessors.
ICCD
Naghmeh Karimi, Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
2009 Misc conf
Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller.
VTS
Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
2009 Misc conf
RT-Level Deviation-Based Grading of Functional Test Sequences.
VTS
Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti
2008 — conf
Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller.
DFT
Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris, Abhijit Jas, Chandra Tirumurti
2007 — conf
Estimating Error Propagation Probabilities with Bounded Variances.
DFT
Hossein Asadi, Mehdi Baradaran Tahoori, Chandra Tirumurti
2005 J jnl
On modeling crosstalk faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sandip Kundu, Sujit T. Zachariah, Yi-Shing Chang, Chandra Tirumurti
2004 A conf
A Modeling Approach for Addressing Power Supply Switching Noise Related Failures of Integrated Circuit.
DATE
Chandra Tirumurti, Sandip Kundu, Susmita Sur-Kolay, Yi-Shing Chang
2003 A conf
On Modeling Cross-Talk Faults.
DATE
Sujit T. Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti