Cen Chen

13 papers Journal 12Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
Cumulative Degradation Modeling of Electrolytic Capacitors Considering Stress Interactions in Industrial Applications.
IEEE Trans. Ind. Electron.
Qisen Sun, Cen Chen, Zicheng Wang, Xuerong Ye, Min Xie, Guofu Zhai
2023 J jnl
Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range.
Qual. Reliab. Eng. Int.
Cen Chen, Chengzhi Sun, Liqin Wu, Xuerong Ye, Guofu Zhai
2023 J jnl
Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate.
IEEE Trans. Reliab.
Bokai Zheng, Cen Chen, Yigang Lin, Xuerong Ye, Guofu Zhai
2022 J jnl
A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling.
Reliab. Eng. Syst. Saf.
Xuerong Ye, Yifan Hu, Bokai Zheng, Cen Chen, Guofu Zhai
2022 J jnl
Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process.
Reliab. Eng. Syst. Saf.
Bokai Zheng, Cen Chen, Yigang Lin, Yifan Hu, Xuerong Ye, Guofu Zhai, Enrico Zio
2021 J jnl
An Adaptive Optimized TVF-EMD Based on a Sparsity-Impact Measure Index for Bearing Incipient Fault Diagnosis.
IEEE Trans. Instrum. Meas.
Xuerong Ye, Yifan Hu, Junxian Shen, Cen Chen, Guofu Zhai
2021 — conf
An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation.
I2MTC
Yun Yang, Cen Chen, Xuerong Ye, Chengzhi Sun
2021 J jnl
Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator.
IEEE Trans. Ind. Electron.
Xuerong Ye, Hao Chen, Cen Chen, Guofu Zhai
2021 J jnl
Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary.
IEEE Access
Cen Chen, Yun Yang, Xuerong Ye, Guofu Zhai
2018 J jnl
A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests.
IEEE Access
Xuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht
2018 J jnl
Fault localization of a switched mode power supply based on extended integer-coded dictionary method.
Microelectron. Reliab.
Xuerong Ye, Cen Chen, Guofu Zhai
2018 J jnl
The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress.
Microelectron. Reliab.
Xuerong Ye, Kaixin Zhang, Cen Chen, Zhongwei Li, Yue Wang, Guofu Zhai
2018 J jnl
VDMOSFET HEF degradation modelling considering turn-around phenomenon.
Microelectron. Reliab.
Xuerong Ye, Cen Chen, Yixing Wang, L. Wang, Guofu Zhai