Carsten Wegener

17 papers A 5C 1Journal 9Unranked 2
YearRankTypeTitle / Venue / Authors
2016 J jnl
Guest Editorial: Analog, Mixed-Signal and RF Testing.
J. Electron. Test.
Gildas Léger, Carsten Wegener
2013 — conf
Method of modeling analog circuits in verilog for mixed-signal design simulations.
ECCTD
Carsten Wegener
2010 J jnl
Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus.
IEEE Trans. Circuits Syst. I Regul. Pap.
Esa Korhonen, Carsten Wegener, Juha Kostamovaara
2009 A conf
An approach to linear model-based testing for nonlinear cascaded mixed-signal systems.
DATE
Reik Müller, Carsten Wegener, Hans-Joachim Jentschel, Sebastian Sattler, Heinz Mattes
2009 J jnl
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores.
J. Electron. Test.
Carsten Wegener, Heinz Mattes, Stéphane Kirmser, Frank Demmerle, Sebastian Sattler
2007 J jnl
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing.
J. Electron. Test.
Carsten Wegener, Michael Peter Kennedy
2006 J jnl
Test Development Through Defect and Test Escape Level Estimation for Data Converters.
J. Electron. Test.
Carsten Wegener, Michael Peter Kennedy
2005 — conf
Innovation to overcome limitations of test equipment.
ECCTD
Carsten Wegener, Michael Peter Kennedy
2005 J jnl
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs.
J. Electron. Test.
Carsten Wegener, Michael Peter Kennedy
2004 J jnl
Linear model-based testing of ADC nonlinearities.
IEEE Trans. Circuits Syst. I Regul. Pap.
Carsten Wegener, Michael Peter Kennedy
2004 J jnl
Testing ADCs for static and dynamic INL - killing two birds with one stone.
Comput. Stand. Interfaces
Carsten Wegener, Michael Peter Kennedy
2003 A conf
Linear Model-Based Error Identification and Calibration for Data Converters.
DATE
Carsten Wegener, Michael Peter Kennedy
2003 A conf
Method of reducing contactor effect when testing high-precision ADCs.
ITC
Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy
2002 A conf
Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs.
ITC
Carsten Wegener, Michael Peter Kennedy
2001 J jnl
Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits.
J. Electron. Test.
Carsten Wegener, Michael Peter Kennedy, Bernd Straube
2000 A conf
Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs.
DATE
Carsten Wegener, Michael Peter Kennedy
2000 C conf
Model-based testing of high-resolution ADCs.
ISCAS
Carsten Wegener, Michael Peter Kennedy