Carol Pyron

13 papers A 9Misc 1Journal 1Unranked 2

Year	Rank	Type	Title / Venue / Authors
2003	—	`conf`	An automated method for test model generation from switch level circuits. ASP-DAC Tim McDougall, Atanas N. Parashkevov, Simon Jolly, Juhong Zhu, Jing Zeng, Carol Pyron, Magdy S. Abadir
2003	—	`conf`	Automated Test Model Generation from Switch Level Custom Circuits. Asian Test Symposium Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu
2002	A	`conf`	Scan and BIST Can Almost Achieve Test Quality Levels. ITC Carol Pyron
2002	A	`conf`	Silicon Symptoms to Solutions: Applying Design for Debug Techniques. ITC Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger
2002	A	`conf`	valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. ITC John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns
2000	Misc	`conf`	At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor. VTS Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina
1999	A	`conf`	DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. ITC Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar
1998	J	`jnl`	Test Strategy for the PowerPC 750 Microprocessor. IEEE Des. Test Comput. Carol Pyron, Javier Prado, James Golab
1997	A	`conf`	Next-Generation PowerPC ITC Carol Pyron, Javier Prado, James Golab
1995	A	`conf`	Implementing 1149.1 in the PowerPC ITC Carol Pyron, William C. Bruce
1992	A	`conf`	EDIF Test - The Upcoming Standard for Test Data Transfers. ITC Michael G. Wahl, Carol Pyron
1991	A	`conf`	Representing Boundary Scan Tests with the EDIF Test View. ITC Carol Pyron
1989	A	`conf`	CAE Functionality for Verification of Diagnostic Programs. ITC Carol Pyron, Rex Sallade