Campbell Millar

24 papers A 3C 2Journal 6Unranked 13

Year	Rank	Type	Title / Venue / Authors
2018	A	`conf`	Progress on carbon nanotube BEOL interconnects. DATE Benjamin Uhlig, Jie Liang, Jaehyun Lee, Raphael Ramos, Abitha Dhavamani, Nicole Nagy, Jean Dijon, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Asen Asenov, Salvatore M. Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, Goncalo Goncalves, Bingan Chen, Reeturaj Pandey, R. Chen, Aida Todri-Sanial
2017	—	`conf`	TCAD based Design-Technology Co-Optimisations in advanced technology nodes. VLSI-DAT Asen Asenov, Karim El Sayed, Ricardo Borges, Plamen Asenov, Campbell Millar, Terry Ma
2015	—	`conf`	Circuit design perspectives for Ge FinFET at 10nm and beyond. ISQED Saurabh Sinha, Lucian Shifren, Vikas Chandra, Brian Cline, Greg Yeric, Robert C. Aitken, Bingjie Cheng, Andrew R. Brown, Craig Riddet, C. Alexandar, Campbell Millar, Asen Asenov
2014	—	`conf`	Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability. ESSDERC Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov
2014	J	`jnl`	Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. Microelectron. Reliab. Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov
2013	—	`conf`	Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models. ICICDT Plamen Asenov, David New, Dave Reid, Campbell Millar, Scott Roy, Asen Asenov
2013	—	`conf`	Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability. ESSDERC Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Jente B. Kuang, Sani R. Nassif, Asen Asenov
2013	—	`conf`	Investigation of SRAM using BTI-aware statistical compact models. ESSDERC Jie Ding, Dave Reid, Campbell Millar, Asen Asenov
2013	C	`conf`	SRAM device and cell co-design considerations in a 14nm SOI FinFET technology. ISCAS Binjie Cheng, Xingsheng Wang, Andrew R. Brown, Jente B. Kuang, Dave Reid, Campbell Millar, Sani R. Nassif, Asen Asenov
2013	J	`jnl`	Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology. IEEE Des. Test Xingsheng Wang, Binjie Cheng, Jente B. Kuang, Andrew R. Brown, Campbell Millar, Asen Asenov
2012	—	`conf`	An advanced statistical compact model strategy for SRAM simulation at reduced VDD. ESSDERC Plamen Asenov, Dave Reid, Scott Roy, Campbell Millar, Asen Asenov
2012	—	`conf`	Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design. ESSDERC Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov
2011	A	`conf`	Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis. DATE Michael Merrett, Plamen Asenov, Yangang Wang, Mark Zwolinski, Dave Reid, Campbell Millar, Scott Roy, Zhenyu Liu, Stephen B. Furber, Asen Asenov
2011	J	`jnl`	The evolution of standard cell libraries for future technology nodes. Genet. Program. Evolvable Mach. James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell
2010	A	`conf`	Capturing intrinsic parameter fluctuations using the PSP compact model. DATE Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov
2010	—	`conf`	Modeling and simulation of transistor and circuit variability and reliability. CICC Asen Asenov, Binjie Cheng, Daryoosh Dideban, Urban Kovac, Negin Moezi, Campbell Millar, Gareth Roy, Andrew R. Brown, Scott Roy
2010	J	`jnl`	Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP. IEEE Des. Test Comput. Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov
2009	—	`conf`	Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. LSSC Asen Asenov, Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard O. Sinnott, Gordon Stewart, Graeme Robert Stewart
2008	C	`conf`	Integrating Security Solutions to Support nanoCMOS Electronics Research. ISPA Richard O. Sinnott, Christopher Bayliss, Thomas Doherty, David B. Martin, Campbell Millar, Gordon Stewart, John P. Watt, Asen Asenov, Gareth Roy, Scott Roy, C. Davenhall, Bruno Harbulot, M. Jones
2008	—	`conf`	Secure, Performance-Oriented Data Management for nanoCMOS Electronics. eScience Richard O. Sinnott, Christopher Bayliss, C. Davenhall, Bruno Harbulot, Mike Jones, Campbell Millar, Gareth Roy, Scott Roy, Gordon Stewart, John P. Watt, Asen Asenov
2008	J	`jnl`	Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. Microelectron. Reliab. Urban Kovac, Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov
2008	J	`jnl`	Supercomputing at Work in the nanoCMOS Electronics Domain. ERCIM News Richard O. Sinnott, Campbell Millar, Asen Asenov
2008	—	`conf`	Supporting Security-Oriented, Collaborative nanoCMOS Electronics Research. ICCS (1) Richard O. Sinnott, Thomas Doherty, David B. Martin, Campbell Millar, Gordon Stewart, John P. Watt
2007	—	`conf`	Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics. eScience Liangxiu Han, Asen Asenov, Dave Berry, Campbell Millar, Gareth Roy, Scott Roy, Richard O. Sinnott, Gordon Stewart